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Ibrahim-Rassoul, N.
29  Ergebnisse:
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1

Investigation of Two-Phase Flow in a Hydrophobic Fuel-Cell ..:

Ibrahim-Rassoul, N. ; Si-Ahmed, E.-K. ; Serir, A....
Energies.  12 (2019)  11 - p. 2061 , 2019
Link: https://doi.org/10.3390/..
 
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2

Investigation of Two-Phase Flow in a Hydrophobic Fuel-Cell ..:

Ibrahim-Rassoul, N ; Si-Ahmed, E.-K ; Serir, A...
info:eu-repo/semantics/altIdentifier/doi/10.3390/en12112061.  , 2019
Link: https://hal.science/hal-..
 
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3

Investigation of Two-Phase Flow in a Hydrophobic Fuel-Cell ..:

Ibrahim-Rassoul, N ; Si-Ahmed, E.-K ; Serir, A...
info:eu-repo/semantics/altIdentifier/doi/10.3390/en12112061.  , 2019
Link: https://hal.science/hal-..
 
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4

Investigation of Two-Phase Flow in a Hydrophobic Fuel-Cell ..:

N. Ibrahim-Rassoul ; E.-K. Si-Ahmed ; A. Serir...
https://www.mdpi.com/1996-1073/12/11/2061.  , 2019
Link: https://doi.org/10.3390/..
 
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5

Investigation of Two-Phase Flow in a Hydrophobic Fuel-Cell ..:

N. Ibrahim-Rassoul ; E.-K. Si-Ahmed ; A. Serir...
I: Energy Fundamentals and Conversion.  , 2019
Link: https://doi.org/10.3390/..
 
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6

Lowest IOFF −21 A/μm in capacitorless DRAM achieved by Reac..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Belmonte, A. ; Kundu, S. ; Subhechha, S.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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7

Degradation Mapping and Impact of Device Dimension on IGZO ..:

Rinaudo, Pietro ; Chasin, A. ; Franco, J....
IEEE Transactions on Device and Materials Reliability.  23 (2023)  3 - p. 337-345 , 2023
Link: https://doi.org/10.1109/..
 
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8

Ultra-low Leakage IGZO-TFTs with Raised Source/Drain for Vt..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Subhechha, S. ; Rassoul, N. ; Belmonte, A.... - p. 292-293 , 2022
Link: https://doi.org/10.1109/..
 
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9

Degradation mapping of IGZO TFTs:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Rinaudo, P. ; Chasin, A. ; Franco, J.... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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10

Device engineering guidelines for performance boost in IGZO..:

, In: 2022 International Conference on IC Design and Technology (ICICDT),
Subhechha, S. ; Rassoul, N. ; Belmonte, A.... - p. 88-88 , 2022
Link: https://doi.org/10.1109/..
 
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11

A Correlative Analysis Flow for Electrical and Structural C..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Magnarin, L. ; Agati, M. ; Belmonte, A.... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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12

Characterizing and Modelling of the BTI Reliability in IGZO..:

, In: 2022 International Electron Devices Meeting (IEDM),
Wu, Z. ; Chasin, A. ; Franco, J.... - p. 30.1.1-30.1.4 , 2022
Link: https://doi.org/10.1109/..
 
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13

Tailoring IGZO-TFT architecture for capacitorless DRAM, dem..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Belmonte, A. ; Oh, H. ; Subhechha, S.... - p. 10.6.1-10.6.4 , 2021
Link: https://doi.org/10.1109/..
 
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14

Understanding and modelling the PBTI reliability of thin-fi..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Chasin, A. ; Franco, J. ; Triantopoulos, K.... - p. 31.1.1-31.1.4 , 2021
Link: https://doi.org/10.1109/..
 
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15

Buried Power Rail Integration with Si FinFETs for CMOS Scal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Gupta, A. ; Mertens, H. ; Tao, Z.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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