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Ichikawa, Tamotsu
85  Ergebnisse:
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1

Low distortion sine wave generator with simple harmonics ca..:

Katayama, Shogo ; Nakatani, Takayuki ; Iimori, Daisuke...
IEICE Electronics Express.  20 (2023)  1 - p. 20220470-20220470 , 2023
Link: https://doi.org/10.1587/..
 
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2

A Physically Unclonable Function Using Time-to-Digital Conv..:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Katoh, Kentaroh ; Yamamoto, Shuhei ; Zhao, Zheming... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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3

12 bit 1 ps Resolution Time-to-Digital Converter for LSI Te..:

, In: Proceedings of Eighth International Congress on Information and Communication Technology; Lecture Notes in Networks and Systems,
Iimori, Daisuke ; Nakatani, Takayuki ; Katayama, Shogo... - p. 217-227 , 2023
Link: https://doi.org/10.1007/..
 
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4

Design Consideration for LC Analog Filters: Inductor ESR Co..:

, In: Proceedings of Eighth International Congress on Information and Communication Technology; Lecture Notes in Networks and Systems,
Takagi, Misaki ; Nakatani, Takayuki ; Katayama, Shogo... - p. 155-166 , 2023
Link: https://doi.org/10.1007/..
 
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5

Low Distortion Sinusoidal Signal Generator with Harmonics C..:

, In: 2023 IEEE International Test Conference (ITC),
Sato, Keno ; Nakatani, Takayuki ; Ishida, Takashi... - p. 47-55 , 2023
Link: https://doi.org/10.1109/..
 
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6

Evaluation of Code Selective Histogram Algorithm For ADC Li..:

, In: 2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia),
Zhao, Yujie ; Katoh, Kentaroh ; Kuwana, Anna... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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7

Innovative Practices Track: Innovative Analog Circuit Testi..:

, In: 2022 IEEE 40th VLSI Test Symposium (VTS),
Mangelsdorf, Chris ; Madhvaraj, Manasa ; Mir, Salvador... - p. 1-1 , 2022
Link: https://doi.org/10.1109/..
 
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8

High Precision Voltage Measurement System Utilizing Low-End..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Sato, Keno ; Nakatani, Takayuki ; Katayama, Shogo... - p. 37-42 , 2022
Link: https://doi.org/10.1109/..
 
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9

Revisit to Histogram Method for ADC Linearity Test: Examina..:

Zhao, Yujie ; Katoh, Kentaroh ; Kuwana, Anna...
Journal of Electronic Testing.  38 (2022)  1 - p. 21-38 , 2022
Link: https://doi.org/10.1007/..
 
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10

Summing Node Test Method: Simultaneous Multiple AC Characte..:

, In: 2020 IEEE 29th Asian Test Symposium (ATS),
Ogihara, Gaku ; Nakatani, Takayuki ; Hatta, Akemi... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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11

Accurate Testing of Precision Voltage Reference by DC-AC Co..:

, In: 2020 IEEE 29th Asian Test Symposium (ATS),
Sato, Keno ; Nakatani, Takayuki ; Ishida, Takashi... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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12

Analog/Mixed-Signal Circuit Testing Technologies in IoT Era:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Kobayashi, Haruo ; Kuwana, Anna ; Wei, Jianglin... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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13

High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Ti..:

, In: 2019 IEEE 13th International Conference on ASIC (ASICON),
Wei, Jiang-Lin ; Ishida, Takashi ; Okamoto, Toshiyuki... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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14

Evaluation of Null Method for Operational Amplifier Short-T..:

, In: 2019 IEEE 13th International Conference on ASIC (ASICON),
Aoki, Riho ; Sato, Keno ; Ishida, Takashi... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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15

Accurate and Fast Testing Technique of Operational Amplifie..:

, In: 2019 IEEE International Test Conference in Asia (ITC-Asia),
Sasaki, Yuto ; Ichikawa, Tamotsu ; Kuwana, Anna... - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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