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Isabell, TC
4  Ergebnisse:
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Hardware Considerations to Optimize Zernike Phase Contrast ..:

Armbruster, B ; Brink, J ; Danev, R...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 554-555 , 2010
Link: https://doi.org/10.1017/..
 
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Aberration-Corrected STEM Imaging Through Off-Site Remote O..:

Jarvis, KA ; Allard, LF ; Jerome, TY...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1330-1331 , 2010
Link: https://doi.org/10.1017/..
 
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3

Remote Teaching for Electron Microscopy:

Isabell, TC ; Ohkura, Y ; Kobayashi, T.
Microscopy and Microanalysis.  14 (2008)  S2 - p. 872-873 , 2008
Link: https://doi.org/10.1017/..
 
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4

New Frontiers in Cryo-electron Tomography with Zernike Phas..:

Armbruster, B ; Brink, J ; Furukawa, H...
Microscopy and Microanalysis.  14 (2008)  S2 - p. 1072-1073 , 2008
Link: https://doi.org/10.1017/..
 
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