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2008 IEEE International Symposium on Circuits and Systems (ISCAS) ,
13
Presetting pulse-based flip-flop:
, In:
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2008 IEEE International Test Conference ,
14
Wafer-Level Characterization of Probecards using NAC Probin:
, In:
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2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers ,
15