Jabs, Dominic
11  Ergebnisse:
Personensuche X
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2

Mixed Hot-Carrier/Bias Temperature Instability Degradation ..:

Jech, Markus ; Rott, Gunnar ; Reisinger, Hans...
IEEE Transactions on Electron Devices.  67 (2020)  8 - p. 3315-3322 , 2020
 
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3

Avalanche breakdown evolution under hot-carrier stress: a n..:

Jabs, Dominic ; Bach, Karl Heinz ; Jungemann, Christoph
Journal of Computational Electronics.  17 (2018)  3 - p. 1249-1256 , 2018
 
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4

A Robust Algorithm for Microscopic Simulation of Avalanche ..:

Jabs, Dominic ; Jungemann, Christoph ; Bach, Karl Heinz
IEEE Transactions on Electron Devices.  62 (2015)  8 - p. 2614-2619 , 2015
 
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6

Hot-carrier degradation at avalanche breakdown: microscopic..:

Jabs, Dominic
info:eu-repo/semantics/altIdentifier/doi/10.18154/RWTH-2017-10706.  , 2017
 
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