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Jagadeesh Chandra, S.V.
254  Ergebnisse:
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1

Solution-based spin cast-processed O-shaped memory devices:

Ramana, CH. V. V. ; Jagadeesh Chandra, S. V. ; Dubey, R. S..
Journal of Materials Science: Materials in Electronics.  32 (2021)  2 - p. 2258-2267 , 2021
Link: https://doi.org/10.1007/..
 
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Substrate temperature influenced ZrO2films for MOS devices:

Kondaiah, Paruchuri ; Jagadeesh Chandra, S.V. ; Fortunato, Elvira...
Surface and Interface Analysis.  52 (2020)  9 - p. 541-546 , 2020
Link: https://doi.org/10.1002/..
 
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3

Effects of post deposition annealing atmosphere on interfac..:

Mallem, Kumar ; Jagadeesh Chandra, S.V. ; Ju, Minkyu...
Thin Solid Films.  675 (2019)  - p. 16-22 , 2019
Link: https://doi.org/10.1016/..
 
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4

Investigations on the Nitride Interface Engineering at HfO2..:

Venkata Rao, G. ; Kumar, M. ; Rajesh, T.V....
Materials Today: Proceedings.  5 (2018)  1 - p. 650-656 , 2018
Link: https://doi.org/10.1016/..
 
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5

Post-deposition annealing influenced structural and electri..:

Chandra Sekhar, M. ; Kondaiah, P. ; Mohan Rao, G...
Superlattices and Microstructures.  62 (2013)  - p. 68-80 , 2013
Link: https://doi.org/10.1016/..
 
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6

Substrate temperature influenced physical properties of sil..:

Chandra Sekhar, M. ; Kondaiah, P. ; Jagadeesh Chandra, S. V...
Surface and Interface Analysis.  44 (2012)  9 - p. 1299-1304 , 2012
Link: https://doi.org/10.1002/..
 
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7

Effect of post metallization annealing on structural and el..:

Jagadeesh Chandra, S.V. ; Kim, Jin-Sung ; Moon, Kyung-Won.
Microelectronic Engineering.  89 (2012)  - p. 76-79 , 2012
Link: https://doi.org/10.1016/..
 
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8

Effect of substrate bias voltage on the structure, electric..:

Chandra Sekhar, M. ; Kondaiah, P. ; Jagadeesh Chandra, S.V...
Applied Surface Science.  258 (2011)  5 - p. 1789-1796 , 2011
Link: https://doi.org/10.1016/..
 
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9

Structural and electrical properties of radio frequency mag..:

Jagadeesh Chandra, S.V. ; Choi, Chel-Jong ; Uthanna, S..
Materials Science in Semiconductor Processing.  13 (2010)  4 - p. 245-251 , 2010
Link: https://doi.org/10.1016/..
 
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10

Substrate bias voltage influenced structural, electrical an..:

Jagadeesh Chandra, S. V. ; Chandrasekhar, M. ; Mohan Rao, G..
Journal of Materials Science: Materials in Electronics.  20 (2008)  4 - p. 295-300 , 2008
Link: https://doi.org/10.1007/..
 
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11

Thermal stability of high-k Er-silicate gate dielectric for..:

Chang, Sung-Yong ; Jeong, Myeong-Il ; Jagadeesh Chandra, S.V....
Materials Science in Semiconductor Processing.  11 (2008)  4 - p. 122-125 , 2008
Link: https://doi.org/10.1016/..
 
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12

Heat treatment induced structural and optical properties of..:

Jagadeesh Chandra, S. V. ; Mohan Rao, G. ; Uthanna, S.
Crystal Research and Technology.  42 (2007)  3 - p. 290-294 , 2007
Link: https://doi.org/10.1002/..
 
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13

Reactive magnetron sputtered aluminum titanate high-к diele..:

Addepalli, Suresh ; Chandra, S. V. Jagadeesh ; Rao, E. V. Krishna.
Applied Physics A.  129 (2023)  11 - p. , 2023
Link: https://doi.org/10.1007/..
 
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14

Structural and electrical properties of TZO MOS capacitors:

Rajvee, Mohammad Hayath ; Chandra, S. V. Jagadeesh ; Rao, B. Eswara..
Applied Physics A.  128 (2022)  12 - p. , 2022
Link: https://doi.org/10.1007/..
 
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15

Investigations on Compositional, Structural and Optical Pro..:

Venkataiah, S. ; Chandra, S. V. Jagadeesh ; Babu, M. Vasu.
Arabian Journal for Science and Engineering.  47 (2021)  6 - p. 7541-7549 , 2021
Link: https://doi.org/10.1007/..
 
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