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Jahdi, Saeed
101  Ergebnisse:
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1

$\beta$-Ga2O3 in Power Electronics Converters: Opportunitie..:

Jahdi, Saeed ; Kumar, Akhil S. ; Deakin, Matthew..
IEEE Open Journal of Power Electronics.  5 (2024)  - p. 554-564 , 2024
Link: https://doi.org/10.1109/..
 
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2

Electrothermal power cycling of 15 kV SiC PiN diodes:

Shen, Chengjun ; Jahdi, Saeed ; Munagala, Sai Priya...
Microelectronics Reliability.  153 (2024)  - p. 115310 , 2024
Link: https://doi.org/10.1016/..
 
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3

High-Energy Dynamic Avalanche to Failure by Incremental Sou..:

Hosseinzadehlish, Mana ; Jahdi, Saeed ; Yuan, Xibo..
IEEE Open Journal of Industry Applications.  5 (2024)  - p. 235-252 , 2024
Link: https://doi.org/10.1109/..
 
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4

A Review of Power Electronic Devices for Heavy Goods Vehicl..:

Alatise, Olayiwola ; Deb, Arkadeep ; Bashar, Erfan...
Energies.  16 (2023)  11 - p. 4380 , 2023
Link: https://doi.org/10.3390/..
 
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5

Degradation Analysis of Planar, Symmetrical and Asymmetrica..:

Yu, Renze ; Jahdi, Saeed ; Mellor, Phil...
IEEE Transactions on Power Electronics.  38 (2023)  9 - p. 10933-10946 , 2023
Link: https://doi.org/10.1109/..
 
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6

Measurements and Review of Failure Mechanisms and Reliabili..:

Yu, Renze ; Jahdi, Saeed ; Alatise, Olayiwola...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  4 - p. 544-563 , 2023
Link: https://doi.org/10.1109/..
 
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7

Electrothermal Power Cycling to Failure of Discrete Planar,..:

Yang, Juefei ; Jahdi, Saeed ; Yu, Renze.
IEEE Open Journal of Power Electronics.  4 (2023)  - p. 887-899 , 2023
Link: https://doi.org/10.1109/..
 
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8

Impact of Turn-Off Gate Voltage and Temperature on Threshol..:

Deb, Arkadeep ; Ortiz-Gonzalez, Jose ; Taha, Mohamed...
Materials Science Forum.  1091 (2023)  - p. 61-66 , 2023
Link: https://doi.org/10.4028/..
 
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9

Investigation of Repetitive Short Circuit Stress as a Degra..:

, In: 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe),
Yu, Renze ; Jahdi, Saeed ; Mellor, Phil... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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10

Analysis of 1st & 3rd Quadrant Electrothermal Robustness of..:

, In: 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe),
Hosseinzadehlish, Mana ; Jahdi, Saeed ; Yuan, Xibo... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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11

Unipolar and Bipolar Pulsed Gate Stresses and Threshold Vol..:

, In: 2022 IEEE Energy Conversion Congress and Exposition (ECCE),
Deb, Arkadeep ; Ortiz Gonzalez, Jose ; Bashar, Erfan... - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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12

Unclamped inductive stressing of GaN and SiC Cascode power ..:

Gunaydin, Yasin ; Jahdi, Saeed ; Yuan, Xibo...
Microelectronics Reliability.  138 (2022)  - p. 114711 , 2022
Link: https://doi.org/10.1016/..
 
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13

On the Repeatability and Reliability of Threshold Voltage M..:

, In: 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe),
Deb, Arkadeep ; Gonzalez, Jose Ortiz ; Bashar, Erfan... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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14

Positive and Negative Bias Temperature Instability on Cross..:

, In: 2022 IEEE Energy Conversion Congress and Exposition (ECCE),
Yang, Juefei ; Jahdi, Saeed ; Stark, Bernard... - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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15

Electrothermal Ruggedness of High Voltage SiC Merged-PiN-Sc..:

, In: 2022 IEEE Energy Conversion Congress and Exposition (ECCE),
Shen, Chengjun ; Jahdi, Saeed ; Yang, Juefei... - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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