Jang, Yunchang
24  Ergebnisse:
Personensuche X
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3

Plasma information-based virtual metrology (PI-VM) and mass..:

Park, Seolhye ; Seong, Jaegu ; Jang, Yunchang...
Journal of the Korean Physical Society.  80 (2022)  8 - p. 647-669 , 2022
 
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5

Characterization of Coupling Coefficient for Transformer Mo..:

, In: 2020 IEEE International Conference on Plasma Science (ICOPS),
Lee, Haneul ; Jang, Yunchang ; Lee, Myeong-Geon... - p. 344-344 , 2020
 
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8

Optical diagnostics for the highly populated tail of an ele..:

Roh, Hyun-Joon ; Kim, Nam-Kyun ; Ryu, Sangwon..
Journal of Physics D: Applied Physics.  50 (2017)  22 - p. 225201 , 2017
 
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10

Observation of oversaturation-induced defect formation in t..:

Jin, Younggil ; Song, Jae-Min ; Roh, Ki-Baek...
Journal of the Korean Physical Society.  69 (2016)  4 - p. 518-524 , 2016
 
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12

Real- time Etch Control to Reduce First Wafer Effect in SF6..:

Ryu, Sangwon ; Jang, Yunchang ; Kwon, Ji-Won...
2018 INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING (ISSM), p. 8651157.  , 2022
 
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14

Plasma information-based virtual metrology (PI-VM) and mass..:

Park, Seolhye ; Seong, Jaegu ; Jang, Yunchang...
Journal of the Korean Physical Society, Vol.80 No.8, pp.647-669.  , 2022
 
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