Je, J.S.
~ 14659000  Ergebnisse:
Personensuche X
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1

Characterization of Interface Trap Density in SiC MOSFETs S..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Stein, S. R. ; Kim, J. ; Das, S... - p. 1-5 , 2024
 
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4

Bridging scales with Machine Learning: From first principle..:

Shojaei, M. Faghih ; Holber, J. ; Das, S....
Journal of the Mechanics and Physics of Solids.  190 (2024)  - p. 105726 , 2024
 
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5

Plant Biodiversity In Homestead Area At Sadar Upazila Of Ra..:

Das, S ; Uddin, MS ; Talucder, MSA.
SAARC Journal of Agriculture.  22 (2024)  1 - p. 203-221 , 2024
 
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9

P1.22-02 Whole Genome Sequencing Analysis of ALK-rearranged..:

Park, H. ; Oh, J. ; Lee, Y....
Journal of Thoracic Oncology.  18 (2023)  11 - p. S244-S245 , 2023
 
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12

Characterization of micro pore optics for full-field X-ray ..:

An, S. ; Krapohl, D. ; Thörnberg, B....
Journal of Instrumentation.  18 (2023)  1 - p. C01017 , 2023
 
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