Jeon, Daniel S.
3967  Ergebnisse:
Personensuche X
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2

Polarimetric iToF: Measuring High-Fidelity Depth Through Sc..:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
Jeon, Daniel S. ; Meuleman, Andreas ; Baek, Seung-Hwan. - p. 12353-12362 , 2023
 
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3

Automated Visual Inspection of Defects in Transparent Displ..:

Jang, Hyeonjoong ; Cho, Sanghoon ; Jeon, Daniel S....
IEEE Transactions on Semiconductor Manufacturing.  36 (2023)  3 - p. 486-493 , 2023
 
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6

Single-shot Hyperspectral-Depth Imaging with Learned Diffra..:

, In: 2021 IEEE/CVF International Conference on Computer Vision (ICCV),
Baek, Seung-Hwan ; Ikoma, Hayato ; Jeon, Daniel S.... - p. 2631-2640 , 2021
 
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7

Fast Omnidirectional Depth Densification:

, In: Advances in Visual Computing; Lecture Notes in Computer Science,
Jang, Hyeonjoong ; Jeon, Daniel S. ; Ha, Hyunho. - p. 683-694 , 2019
 
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10

Simultaneous acquisition of polarimetric SVBRDF and normals:

Baek, Seung-Hwan ; Jeon, Daniel S. ; Tong, Xin.
ACM Transactions on Graphics (TOG).  37 (2018)  6 - p. 1-15 , 2018
 
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12

Practical multiple scattering for rough surfaces:

Lee, Joo Ho ; Jarabo, Adrian ; Jeon, Daniel S...
ACM Transactions on Graphics.  37 (2018)  6 - p. 1-12 , 2018
 
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13

Practical multiple scattering for rough surfaces:

Lee, Joo Ho ; Jarabo, Adrian ; Jeon, Daniel S...
ACM Transactions on Graphics (TOG).  37 (2018)  6 - p. 1-12 , 2018
 
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15

High-quality hyperspectral reconstruction using a spectral ..:

Choi, Inchang ; Jeon, Daniel S. ; Nam, Giljoo..
ACM Transactions on Graphics (TOG).  36 (2017)  6 - p. 1-13 , 2017
 
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