Moens, Peter ;
Banerjee, Abhishek ;
Constant, Aurore...
Moens , P , Banerjee , A , Constant , A , Coppens , P , Caesar , M , Li , Z , Vanderweghe , S , Declercq , F , Padmanabhan , B , Jeon , W , Guo , J , Salih , A , Tack , M , Meneghini , M , Dalcanale , S , Tajilli , A , Meneghesso , G , Zanoni , E , Uren , M , Chatterjee , I , Karboyan , S & Kuball , M 2016 , (Invited) intrinsic reliability assessment of 650V rated AlGaN/GaN based power devices : an industry perspective . in F Roozeboom , V Narayanan , K Kakushima , P J Timans , E P Gusev , Z Karim & S De Gendt (eds) , 229th ECS Meeting May 29, 2016 - June 2, 2016 San Diego, CA : Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 6 . ECS Transactions , no. 4 , vol. 72 , The Electrochemical Society, Inc , pp. 65-76 . https://doi.org/10.1149/07204.0065ecst.
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2016