E-LIB Suche - Ergebnisse für: Jeon, Woochul

1

N2O plasma treatment effect on reliability of p-GaN gate Al..:

Park, Jun Hyuk ; Hwang, Sun-Kyu ; Kim, Joonyong...
Applied Physics Letters. 120 (2022) 13 - p. , 2022

Link: https://doi.org/10.1063/..

2

A Pathway to Improve the Reliability of p-GaN Gate HEMTs th..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),

Hwang, Injun ; Jeon, Woochul ; Hwang, Sun-Kyu... - p. 61-64 , 2022

Link: https://doi.org/10.1109/..

3

(Invited) Intrinsic Reliability Assessment of 650V Rated Al..:

Moens, Peter ; Banerjee, Abhishek ; Constant, Aurore...
ECS Transactions. 72 (2016) 4 - p. 65-76 , 2016

Link: https://doi.org/10.1149/..

4

Breakthroughs for 650-V GaN Power Devices: Stable high-temp..:

Liu, Charlie ; Salih, Ali ; Padmanabhan, Balaji...
IEEE Power Electronics Magazine. 2 (2015) 3 - p. 44-50 , 2015

Link: https://doi.org/10.1109/..

5

On-Chip RF Pulse Power Detector Using FIB as a Post-CMOS Fa..:

Jeon, Woochul ; Firestone, Todd M. ; Rodgers, John C..
Electromagnetics. 26 (2006) 1 - p. 103-109 , 2006

Link: https://doi.org/10.1080/..

6

CMOS and post-CMOS on-chip microwave pulse power detectors:

Jeon, Woochul ; Melngailis, John
Solid-State Electronics. 50 (2006) 6 - p. 951-958 , 2006

Link: https://doi.org/10.1016/..

7

Design and fabrication of Schottky diode, on-chip RF power ..:

Jeon, Woochul ; Firestone, Todd M. ; Rodgers, John C..
Solid-State Electronics. 48 (2004) 10-11 - p. 2089-2093 , 2004

Link: https://doi.org/10.1016/..

8

(Invited) intrinsic reliability assessment of 650V rated Al..:

Moens, Peter ; Banerjee, Abhishek ; Constant, Aurore...
Moens , P , Banerjee , A , Constant , A , Coppens , P , Caesar , M , Li , Z , Vanderweghe , S , Declercq , F , Padmanabhan , B , Jeon , W , Guo , J , Salih , A , Tack , M , Meneghini , M , Dalcanale , S , Tajilli , A , Meneghesso , G , Zanoni , E , Uren , M , Chatterjee , I , Karboyan , S & Kuball , M 2016 , (Invited) intrinsic reliability assessment of 650V rated AlGaN/GaN based power devices : an industry perspective . in F Roozeboom , V Narayanan , K Kakushima , P J Timans , E P Gusev , Z Karim & S De Gendt (eds) , 229th ECS Meeting May 29, 2016 - June 2, 2016 San Diego, CA : Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 6 . ECS Transactions , no. 4 , vol. 72 , The Electrochemical Society, Inc , pp. 65-76 . https://doi.org/10.1149/07204.0065ecst. , 2016

Link: https://hdl.handle.net/1..

9

Boolean circuit programming: A new paradigm to design paral..:

Park, Kunsoo ; Park, Heejin ; Jeon, Woo-Chul.
Journal of Discrete Algorithms 7 (2) (2009) 267-277. , 2009

Link: https://hdl.handle.net/1..

10

Revitalizing Oxygen Reduction Reactivity of Composite Oxide..:

Nam, Seongwoo ; Kim, Jinwook ; Kim, Hyunseung...
Advanced Materials. 36 (2024) 25 - p. , 2024

Link: https://doi.org/10.1002/..

11

Simultaneous Performance and Stability Enhancement in Inter..:

Jo, Sung Eun ; Jeon, SungHyun ; Kim, Hyong June...
Small Methods. 8 (2024) 1 - p. , 2024

Link: https://doi.org/10.1002/..

12

Revitalizing Oxygen Reduction Reactivity of Composite Oxide..:

Nam, Seongwoo ; Kim, Jinwook ; Kim, Hyunseung...
Advanced Materials. 36 (2024) 25 - p. , 2024

Link: https://doi.org/10.1002/..

13

Concurrent Amorphization and Nanocatalyst Formation in Cu‐S..:

Jeon, SungHyun ; Jung, Wan‐Gil ; Bae, Hohan...
Advanced Materials. , 2024

Link: https://doi.org/10.1002/..

14

Maximizing Photoelectrochemical Performance in Metal‐Oxide ..:

Kim, Myeong‐Jin ; Hassan, Mostafa Afifi ; Lee, Changhoon...
Small. 20 (2024) 18 - p. , 2024

Link: https://doi.org/10.1002/..

15

Enhanced catalytic activity and stability of SOFC electrode..:

Shin, Hyunduck ; Seo, Jongsu ; Jeon, SungHyun...
Journal of Materials Chemistry A. 12 (2024) 18 - p. 10695-10703 , 2024

Link: https://doi.org/10.1039/..