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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Exploring the Reliability Limits for the Z-Pitch Scaling of..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
7
Investigation of the Impact of Ferroelectricity Boosted Gat..:
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2024 IEEE International Memory Workshop (IMW) ,
8
Pure-Metal Replacement Gate for Reliable 30 nm Pitch Scaled..:
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2023 International Electron Devices Meeting (IEDM) ,
11
Enhanced Endurance Characteristics in High Performance 16nm..:
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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
13
Comprehensive Study on Cherenkov Radiation for Ultrafast PE..:
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2023 IEEE Signal Processing in Medicine and Biology Symposium (SPMB) ,
15