Personensuche
X
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Evaluation of Burn-in Technique on Gate Oxide Reliability i..:
, In:
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
3
Investigation of the Electron Trapping in Commercial Thick ..:
, In:
?
2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) ,
5
Investigation of the Constant Current Stress for Charge-to-..:
, In:
?
2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) ,
9
An Effective Screening Technique for Early Oxide Failure in..:
, In:
?
Robotic and Navigated Spine Surgery ,
10
Artificial Intelligence and Machine Learning in Spine Surge..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
11
Reliability Comparison of Commercial Planar and Trench 4H-S..:
, In:
?
2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) ,
12
Pulse-Voltage Time-Dependent Dielectric Breakdown of Commer..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
13
Investigation of different screening methods on threshold v..:
, In:
?
Lecture Notes in Computer Science; Computer Vision – ECCV 2022 ,
15