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Jiruse, Jaroslav
19  Ergebnisse:
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1

A New Generation Plasma FIB Column with Higher Probe Curren..:

Hrnčíř, Tomáš ; Nešpor, Dušan ; Radi, Zsolt...
Microscopy and Microanalysis.  26 (2020)  S2 - p. 412-413 , 2020
Link: https://doi.org/10.1017/..
 
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2

An Optimized In-column Detection System for the Ultra-high ..:

Jiruše, Jaroslav ; Sytař, Petr ; Páral, Jan.
Microscopy and Microanalysis.  26 (2020)  S2 - p. 1806-1807 , 2020
Link: https://doi.org/10.1017/..
 
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3

TESCAN Approaches to Biological Field Emission Scanning Ele..:

, In: Biological Field Emission Scanning Electron Microscopy,
Jiruše, Jaroslav ; Košťál, Vratislav ; Lencová, Bohumila - p. 79-101 , 2019
Link: https://doi.org/10.1002/..
 
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4

Detection Systems of Ultra-High-Resolution SEMs:

Jiruse, Jaroslav ; Havelka, Miloslav ; Polster, Jan...
Microscopy and Microanalysis.  24 (2018)  S1 - p. 606-607 , 2018
Link: https://doi.org/10.1017/..
 
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5

S9000X - Next Generation of Ultra-High Resolution SEM for E..:

Havelka, Miloslav ; Jiruse, Jaroslav ; Hrncif, Tomas...
Microscopy and Microanalysis.  24 (2018)  S1 - p. 1116-1117 , 2018
Link: https://doi.org/10.1017/..
 
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6

A Detection System with Controlled Surface Sensitivity for ..:

Sytaf, Petr ; Jiruse, Jaroslav ; Paral, Jan
Microscopy and Microanalysis.  23 (2017)  S1 - p. 24-25 , 2017
Link: https://doi.org/10.1017/..
 
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7

A New SEM Column Combining Ultra-High Resolution and Flexib..:

Sytaf, Petr ; Jiruse, Jaroslav ; Zavodny, Adam
Microscopy and Microanalysis.  23 (2017)  S1 - p. 38-39 , 2017
Link: https://doi.org/10.1017/..
 
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8

Design of an Ultra-High Resolution SEM for Enhanced Analysi:

Jiruse, Jaroslav ; Havelka, Miloslav ; Polster, Jan
Microscopy and Microanalysis.  22 (2016)  S3 - p. 578-579 , 2016
Link: https://doi.org/10.1017/..
 
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9

On the Calculation of SEM and FIB Beam Profiles:

Kološová, Jolana ; Hrnčíř, Tomáš ; Jiruše, Jaroslav..
Microscopy and Microanalysis.  21 (2015)  S4 - p. 206-211 , 2015
Link: https://doi.org/10.1017/..
 
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10

Insulator Analysis Using Combined FIB-SEM instrument with T..:

Sedláček, Libor ; Kološová, Jolana ; Jiruše, Jaroslav.
Microscopy and Microanalysis.  20 (2014)  S3 - p. 306-307 , 2014
Link: https://doi.org/10.1017/..
 
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11

New High-Resolution Low-Voltage and High Performance Analyt..:

Jiruše, Jaroslav ; Havelka, Miloslav ; Haničinec, Martin..
Microscopy and Microanalysis.  20 (2014)  S3 - p. 1104-1105 , 2014
Link: https://doi.org/10.1017/..
 
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12

FIB-SEM Instrument with Integrated Raman Spectroscopy for C..:

Jiruse, Jaroslav ; Hanicinec, Martin ; Havelka, Miloslav...
Microscopy and Microanalysis.  20 (2014)  S3 - p. 990-991 , 2014
Link: https://doi.org/10.1017/..
 
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13

Novel Cathodoluminescence Detector with Extremely Large Fie..:

Kološová, Jolana ; Jiruše, Jaroslav
Microscopy and Microanalysis.  20 (2014)  S3 - p. 912-913 , 2014
Link: https://doi.org/10.1017/..
 
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14

Novel field emission SEM column with beam deceleration tech..:

Jiruše, Jaroslav ; Havelka, Miloslav ; Lopour, Filip
Ultramicroscopy.  146 (2014)  - p. 27-32 , 2014
Link: https://doi.org/10.1016/..
 
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15

High Spatial Resolution Time-of-Flight Secondary Ion Mass S..:

Whitby, James A. ; Östlund, Fredrik ; Horvath, Peter...
Advances in Materials Science and Engineering.  2012 (2012)  - p. 1-13 , 2012
Link: https://doi.org/10.1155/..
 
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