Jong Duk Lee
6115  Ergebnisse:
Personensuche X
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1

Effect of source extension junction depth and substrate dop..:

Woo Young Choi ; Jae Young Song ; Jong Duk Lee.
IEEE Transactions on Electron Devices.  53 (2006)  5 - p. 1282-1285 , 2006
 
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2

Breakdown voltage reduction in I-MOS devices:

, In: 2006 IEEE Nanotechnology Materials and Devices Conference,
Woo Young Choi ; Jae Young Song ; Jong Pil Kim... - p. None , 2006
 
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3

70-nm impact-ionization metal-oxide-semiconductor (I-MOS) d..:

, In: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.,
Woo Young Choi ; Jae Young Song ; Jong Duk Lee.. - p. 955-958 , 2005
 
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4

25nm Programmable Virtual Source/Drain MOSFETs Using a Twin..:

, In: 2005 International Semiconductor Device Research Symposium,
Woo Young Choi ; Byung Yong Choi ; Ju Hee Park... - p. 388,389 , 2005
 
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6

Nano-scale MOSFETs with programmable virtual source/drain:

, In: Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC.,
Byung Yong Choi ; Yong-Kyu Lee ; Woo Young Choi... - p. 213-214 vol.1 , 2004
 
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7

Programmable virtual source/drain MOSFETs:

, In: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850),
Byung Yong Choi ; Yong Kyu Lee ; Woo Young Choi... - p. 229-232 , 2004
 
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8

Stable threshold voltage extraction using Tikhonov's regula..:

Woo Young Choi ; Hwi Kim ; Byoungho Lee..
IEEE Transactions on Electron Devices.  51 (2004)  11 - p. 1833-1839 , 2004
 
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9

80nm self-aligned complementary I-MOS using double sidewall..:

, In: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004.,
Woo Young Choi ; Jae Young Song ; Byung Yong Choi... - p. 203,204,205,206 , 2004
 
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10

Stable extraction of linearity (V/sub IP3/) for nanoscale R..:

Woo Young Choi ; Byung Yong Choi ; Dong-Soo Woo..
IEEE Microwave and Wireless Components Letters.  14 (2004)  2 - p. 83-85 , 2004
 
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11

A new fabrication method for self-aligned nanoscale I-MOS (..:

, In: Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC.,
Woo Young Choi ; Byung Yong Choi ; Dong-Soo Woo.. - p. 211-212 vol.1 , 2004
 
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12

A new linearity measurement algorithm for sub-micron microw..:

, In: Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412),
Woo Young Choi ; Byung Yong Choi ; Dong-Soo Woo.. - p. 374,375,376 , 2003
 
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13

Reverse-order source/drain formation with double offset spa..:

, In: Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003. ISLPED '03.,
Woo Young Choi ; Jong Duk Lee ; Byung-Gook Park - p. 189,190,191,192 , 2003
 
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14

30 nm MOSFET development based on processes for nanotechnol..:

, In: ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575),
Jong Duk Lee ; Woo Young Choi ; Byung Yong Choi... - p. 251,252,253,254 , 2002
 
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