Jong-Ho Lee
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1

Negative voltage bandgap reference with multilevel curvatur..:

Liu, Xi ; Liu, Qian ; Jin, Xiaoshi..
Journal of Semiconductors.  37 (2016)  5 - p. 055008 , 2016
 
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3

High speed SOI buffer circuit with the efficient connection..:

, In: 1997 IEEE International SOI Conference Proceedings,
Jong-Ho Lee ; Young-June Park - p. 152,153 , 1997
 
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4

NOR-Type Flash Array Based on Four-Terminal TFT Synaptic De..:

Hwang, Joon ; Park, Min-Kyu ; Kang, Won-Mook...
IEEE Electron Device Letters.  45 (2024)  6 - p. 1000-1003 , 2024
 
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6

Vertical AND-Type Flash Synaptic Cell Stack for High-Densit..:

Kim, Jangsaeng ; Im, Jiseong ; Oh, Seongbin...
IEEE Electron Device Letters.  45 (2024)  7 - p. 1369-1372 , 2024
 
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7

Efficacy of plasma treatment for surface cleansing and osse..:

Bae, Gang-Ho ; Cho, Won-Tak ; Lee, Jong-Ho.
The Journal of Advanced Prosthodontics.  16 (2024)  3 - p. 189 , 2024
 
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8

Reliability of FET-type gas sensor with asymmetric air-gap ..:

Park, Jinwoo ; Jung, Gyuweon ; Shin, Wonjun...
Sensors and Actuators B: Chemical.  405 (2024)  - p. 135349 , 2024
 
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9

Position-Based Adaptive Beamforming and Roadside Unit Secto..:

Song, Jiho ; Lee, Jong-Ho ; Noh, Song
IEEE Transactions on Vehicular Technology.  73 (2024)  2 - p. 2960-2965 , 2024
 
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10

Disruption of phosphofructokinase activity and aerobic glyc..:

Park, Su Hwan ; Kim, Gyuri ; Yang, Gi-Eun...
Journal of Hazardous Materials.  464 (2024)  - p. 132966 , 2024
 
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11

Metformin Suppresses Both PD-L1 Expression in Cancer Cells ..:

Park, Su Hwan ; Lee, Juheon ; Yun, Hye Jin..
Annals of Laboratory Medicine.  44 (2024)  5 - p. 426-436 , 2024
 
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12

CMOS-Compatible Barometric Pressure Field-Effect Transistor..:

Lee, Chayoung ; Shin, Wonjun ; Jung, Gyuweon...
IEEE Electron Device Letters.  45 (2024)  3 - p. 464-467 , 2024
 
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13

Significant Reduction of 1/f Noise in Organic Thin-Film Tra..:

Shin, Wonjun ; Bae, Jisuk ; Park, Joon Hyung...
IEEE Electron Device Letters.  45 (2024)  4 - p. 704-707 , 2024
 
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14

Reliability Improvement in Vertical NAND Flash Cells Using ..:

Park, Sung-Ho ; Yoo, Ho-Nam ; Yang, Yeongheon..
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1834-1838 , 2024
 
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