E-LIB Suche - Ergebnisse für: Kaczer, Ben

1

Light-Assisted Investigation of the Role of Oxygen Flow dur..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Rinaudo, Pietro ; Chasin, Adrian ; Zhao, Ying... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

2

Fundamental understanding of NBTI degradation mechanism in ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Zhao, Ying ; Rinaudo, Pietro ; Chasin, Adrian... - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

3

Silent Data Corruption: Test or Reliability Problem?:

, In: 2024 IEEE European Test Symposium (ETS),

Marinissen, Erik Jan ; Dattatraya Dixit, Harish ; Blanton, Shawn... - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

4

Evidence of contact-induced variability in industrially-fab..:

Panarella, Luca ; Kaczer, Ben ; Smets, Quentin...
npj 2D Materials and Applications. 8 (2024) 1 - p. , 2024

Link: https://doi.org/10.1038/..

5

Demonstration of Chip Overclock Detection by Employing Tamp..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Diaz-Fortuny, Javier ; Saraza-Canflanca, Pablo ; Romano-Molar, Alex... - p. 4C.1-1-4C.1-7 , 2024

Link: https://doi.org/10.1109/..

6

An In-Depth Study of Ring Oscillator Reliability under Acce..:

Diaz-Fortuny, Javier ; Saraza-Canflanca, Pablo ; Bury, Erik..
Micromachines. 15 (2024) 6 - p. 769 , 2024

Link: https://doi.org/10.3390/..

7

Device‐to‐Materials Pathway for Electron Traps Detection in..:

Slassi, Amine ; Medondjio, Linda‐Sheila ; Padovani, Andrea...
Advanced Electronic Materials. 9 (2023) 4 - p. , 2023

Link: https://doi.org/10.1002/..

8

Understanding the Excess 1/f Noise in MOSFETs at Cryogenic ..:

Asanovski, Ruben ; Grill, Alexander ; Franco, Jacopo...
IEEE Transactions on Electron Devices. 70 (2023) 4 - p. 2135-2141 , 2023

Link: https://doi.org/10.1109/..

9

Compact Physics Hot-Carrier Degradation Model Valid over a ..:

Tyaginov, Stanislav ; Bury, Erik ; Grill, Alexander...
Micromachines. 14 (2023) 11 - p. 2018 , 2023

Link: https://doi.org/10.3390/..

10

Analytical Markov Model to Calculate TDDB at Any Voltage an..:

Vici, Andrea ; Degraeve, Robin ; Franco, Jacopo...
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6512-6519 , 2023

Link: https://doi.org/10.1109/..

11

Investigating the correlation between interface and dielect..:

Asanovski, Ruben ; Franco, Jacopo ; Palestri, Pierpaolo..
Solid-State Electronics. 207 (2023) - p. 108722 , 2023

Link: https://doi.org/10.1016/..

12

Comphy v3.0—A compact-physics framework for modeling charge..:

Waldhoer, Dominic ; Schleich, Christian ; Michl, Jakob...
Microelectronics Reliability. 146 (2023) - p. 115004 , 2023

Link: https://doi.org/10.1016/..

13

Improving the Tamper-Aware Odometer Concept by Enhancing Dy..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Diaz-Fortuny, Javier ; Sangani, Dishant ; Saraza-Canflanca, Pablo... - p. 1-9 , 2023

Link: https://doi.org/10.1109/..

14

A Pragmatic Model to Predict Future Device Aging:

Brown, James ; Tok, Kean Hong ; Gao, Rui...
IEEE Access. 11 (2023) - p. 127725-127736 , 2023

Link: https://doi.org/10.1109/..

15

Physics-Based and Closed-Form Model for Cryo-CMOS Subthresh..:

Beckers, Arnout ; Michl, Jakob ; Grill, Alexander...
IEEE Transactions on Nanotechnology. 22 (2023) - p. 590-596 , 2023

Link: https://doi.org/10.1109/..