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Kaminski, Nando
49  Ergebnisse:
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1

Effects of the LPCVD Gate Dielectric Deposition Temperature..:

Henn, Mirjam ; Huber, Christian ; Scholten, Dick.
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1553-1560 , 2024
Link: https://doi.org/10.1109/..
 
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2

Verification of Hygrothermal Simulations Using Silicone Enc..:

, In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia),
Frohling, Soren ; Kostka, Benedikt ; Wenzel, Johannes C.... - p. 1361-1369 , 2023
Link: https://doi.org/10.23919..
 
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3

Lifetime Modeling of SiC MOSFET Power Modules During Power ..:

, In: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hoffmann, Felix ; Schmitt, Stefan ; Kaminski, Nando - p. 294-297 , 2023
Link: https://doi.org/10.1109/..
 
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4

Reliability of SiC MOSFET Power Modules under Consecutive H..:

Hoffmann, Felix ; Schmitt, Stefan ; Kaminski, Nando
Materials Science Forum.  1092 (2023)  - p. 127-133 , 2023
Link: https://doi.org/10.4028/..
 
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5

Power Cycling on Lateral GaN and β-Ga2O3 Transistors:

Rugen, Sarah ; Brunko, Alexander ; Hoffmann, Felix.
Materials Science Forum.  1092 (2023)  - p. 157-164 , 2023
Link: https://doi.org/10.4028/..
 
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6

Field-Data based Lab Testing of a Wind-Energy Power Convert..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),
Zorn, Christian ; Peters, Jan-Hendrik ; Hanf, Michael... - p. 1-10 , 2023
Link: https://doi.org/10.23919..
 
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7

Humidity Robustness of 3.3kV SiC-MOSFETs for Traction Appli..:

Hanf, Michael ; Peters, Jan-Hendrik ; Hoffmann, Felix.
Materials Science Forum.  1092 (2023)  - p. 171-177 , 2023
Link: https://doi.org/10.4028/..
 
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8

Simulation and Modeling of SiC High Power Diodes:

Huang, Yaren , 2022
Link: http://nbn-resolving.de/..
 
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9

Comparison of the H3TRB Performance of Silicon and Silicon ..:

Hoffmann, Felix ; Schmitt, Stefan ; Kaminski, Nando
Materials Science Forum.  1062 (2022)  - p. 487-492 , 2022
Link: https://doi.org/10.4028/..
 
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10

Impact of the Chip Properties on the Power Cycling Performa..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hoffmann, Felix ; Kaminski, Nando - p. 21-24 , 2022
Link: https://doi.org/10.1109/..
 
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11

Investigation on the Impact of Environmental Stress on the ..:

, In: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hoffmann, Felix ; Kaminski, Nando ; Schmitt, Stefan - p. 371-374 , 2021
Link: https://doi.org/10.23919..
 
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12

Analyse und Optimierung von AlGaN/GaN-HEMTs in der leistung.. 

Elektrische Energietechnik an der TU Berlin ; 11
Böcker, Jan , 2020
Link: https://nbn-resolving.de..
 
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13

Impact of Combined Thermo-Mechanical and Electro-Chemical S..:

, In: 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe),
Hoffmann, Felix ; Schmitt, Stefan ; Kaminski, Nando - p. P.1-P.8 , 2020
Link: https://doi.org/10.23919..
 
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14

Impact of the sensing current density on PN-junction based ..:

Hoffmann, Felix ; Rugen, Sarah ; Silber, Dieter.
Microelectronics Reliability.  114 (2020)  - p. 113834 , 2020
Link: https://doi.org/10.1016/..
 
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15

Power Cycling Performance and Lifetime Estimation of 1700V ..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hoffmann, Felix ; Kaminski, Nando - p. 537-540 , 2020
Link: https://doi.org/10.1109/..
 
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