Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Kang, Bongkoo
59  Ergebnisse:
Personensuche X
?
1

Channel-length dependence of the generation of interface st..:

Kim, Hyeokjin ; Roh, Giyoun ; Kang, Bongkoo
Japanese Journal of Applied Physics.  59 (2020)  SM - p. SMMC02 , 2020
Link: https://doi.org/10.35848..
 
?
2

Circuit Structure and Control Method to Reduce Size and Har..:

Cho, Min-Gi ; Lee, Sang-Hoon ; Lee, Hyeon-Seok..
Energies.  13 (2020)  6 - p. 1531 , 2020
Link: https://doi.org/10.3390/..
 
?
3

Understanding the Ukrainian Conflict from the Perspective o..:

Kang, Bong-koo
Region.  9 (2020)  2 - p. 1-28 , 2020
Link: https://www.jstor.org/st..
 
?
4

Characterization of fast relaxation by oxide-trapped charge..:

Kim, Hyeokjin ; Roh, Giyoun ; Kang, Bongkoo
Japanese Journal of Applied Physics.  59 (2020)  SM - p. SMMA01 , 2020
Link: https://doi.org/10.35848..
 
?
5

Characterization of positive bias temperature instability c..:

Roh, Giyoun ; Kim, Hyeokjin ; Kwon, Youngkyu.
Microelectronics Reliability.  100-101 (2019)  - p. 113444 , 2019
Link: https://doi.org/10.1016/..
 
?
6

Wireless Battery Charging Circuit Using Load Estimation wit..:

Lee, Sang-Won ; Choi, Yoon-Geol ; Kim, Jung-Ha.
Energies.  12 (2019)  23 - p. 4489 , 2019
Link: https://doi.org/10.3390/..
 
?
7

Active Charge Equalizer of Li-Ion Battery Cells Using Doubl..:

Lee, Sang-Won ; Choi, Yoon-Geol ; Kang, Bongkoo
Energies.  12 (2019)  12 - p. 2290 , 2019
Link: https://doi.org/10.3390/..
 
?
8

High-efficiency Bidirectional Buck–Boost Converter for Resi..:

Ham, Seok-Hyeong ; Choi, Yoon-Geol ; Lee, Hyeon-Seok...
Energies.  12 (2019)  19 - p. 3786 , 2019
Link: https://doi.org/10.3390/..
 
?
9

Channel-length dependence of mechanical stress effect by hy..:

Kim, Hyeokjin ; Roh, Giyoun ; Kwon, Young-Kyu.
Microelectronics Reliability.  100-101 (2019)  - p. 113424 , 2019
Link: https://doi.org/10.1016/..
 
?
10

Effect of oxide-trapped charge on the anomalous drain avala..:

Yun, Yeohyeok ; Seo, Ji-Hoon ; Kwon, Young-Kyu.
Microelectronics Reliability.  100-101 (2019)  - p. 113449 , 2019
Link: https://doi.org/10.1016/..
 
?
11

Reduction of input voltage/current ripples of boost half-br..:

Lee, Hyeon-Seok ; Kang, Bongkoo ; Kim, Wook-Sung.
Solar Energy.  188 (2019)  - p. 1084-1101 , 2019
Link: https://doi.org/10.1016/..
 
?
12

Compact Single-Stage Micro-Inverter with Advanced Control S..:

Choi, Yoon-Geol ; Lee, Hyeon-Seok ; Kang, Bongkoo..
Energies.  12 (2019)  7 - p. 1234 , 2019
Link: https://doi.org/10.3390/..
 
?
13

Effect of HfSiON thickness on electron trap distributions o..:

Roh, Giyoun ; Kim, Hyeokjin ; Kwon, Youngkyu.
Microelectronics Reliability.  100-101 (2019)  - p. 113353 , 2019
Link: https://doi.org/10.1016/..
 
?
14

Method to estimate profile of threshold voltage degradation..:

Yun, Yeohyeok ; Seo, Ji-Hoon ; Son, Donghee.
Microelectronics Reliability.  88-90 (2018)  - p. 186-190 , 2018
Link: https://doi.org/10.1016/..
 
?
15

Increase in Power Conversion Efficiency of Bidirectional DC..:

Choi, Yoon-Geol ; Lee, Sang-Won ; Lee, Hyeon-Seok..
IEEE Transactions on Power Electronics.  33 (2018)  12 - p. 10539-10549 , 2018
Link: https://doi.org/10.1109/..
 
1-15