Kariat, Vinod
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Challenges in gate level modeling for delay and SI at 65nm ..:

, In: Proceedings of the 45th annual Design Automation Conference,
Keller, Igor ; Tam, King Ho ; Kariat, Vinod - p. 468-473 , 2008
 
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Session details: Emerging topics in signal integrity and re..:

, In: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design,
 
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Session details: Statistical timing analysis:

, In: Proceedings of the 42nd annual Design Automation Conference,
 
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Static noise analysis with noise windows:

, In: Proceedings of the 40th annual Design Automation Conference,
Tseng, Ken ; Kariat, Vinod - p. 864-868 , 2003
 
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