Karim, Zia
129  Ergebnisse:
Personensuche X
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1

High Aspect Ratio (AR) Through Glass Via (TGV) Etch Perform..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
 
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2

Various Defect Mechanism Analysis for Optimization of Vacuu..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Jing, Lei ; Lin, Alvin ; Tan, Xinxuan... - p. 1-7 , 2024
 
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3

Impact of Process Parameters on Vacuum Fluxless Solder Refl..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Jing, Lei ; Kudriavtsev, Vladimir ; Nguyen, Taylor... - p. 1541-1548 , 2023
 
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4

Impact of Thermal Annealing and Other Process Parameters on..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Ajayi, Taiwo ; Gatimu, Alvin ; Brun, Xavier F.... - p. 1426-1432 , 2023
 
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6

Reducing the Thermal Budget in Low-Temperature Polyimide Di..:

, In: 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC),
Karim, Zia ; Song, Kay ; Sandstrom, Cliff... - p. 551-554 , 2022
 
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7

Better Thermal, Mechanical and Dielectric Properties of Cur..:

, In: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
Karim, Zia ; Sautter, Kenneth ; Song, Kay... - p. 321-326 , 2020
 
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8

Preface—Focus Issue on 2D Layered Materials: From Fundament..:

Jaegermann, Wolfram ; Karim, Zia ; Obeng, Yaw.
ECS Journal of Solid State Science and Technology.  9 (2020)  9 - p. 090001 , 2020
 
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9

Preface—Focus Issue on 2D Layered Materials: From Fundament..:

Jaegermann, Wolfram ; Karim, Zia ; Obeng, Yaw.
Journal of The Electrochemical Society.  167 (2020)  14 - p. 140001 , 2020
 
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