E-LIB Suche - Ergebnisse für: Karimi, Naghmeh

1

DELFINES: Detecting Laser Fault Injection Attacks via Digit..:

Ebrahimabadi, Mohammad ; Mehjabin, Suhee Sanjana ; Viera, Raphael...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 43 (2024) 3 - p. 774-787 , 2024

Link: https://doi.org/10.1109/..

2

Securing ISW Masking Scheme Against Glitches:

, In: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE),

Takarabt, Sofiane ; Bahrami, Javad ; Ebrahimabadi, Mohammad.. - p. 1-2 , 2024

Link: https://doi.org/10.23919..

3

Digital Twin Integrity Protection in Distributed Control Sy..:

, In: 2024 IEEE 21st Consumer Communications & Networking Conference (CCNC),

Ebrahimabadi, Mohammad ; Bahrami, Javad ; Younis, Mohamed. - p. 540-545 , 2024

Link: https://doi.org/10.1109/..

4

Digital Twin Based Topology Fingerprinting for Detecting Fa..:

, In: ICC 2024 - IEEE International Conference on Communications,

Bahrami, Javad ; Ebrahimabadi, Mohammad ; Younis, Mohamed. - p. 2053-2058 , 2024

Link: https://doi.org/10.1109/..

5

On the Resiliency of Protected Masked S-Boxes Against Templ..:

Anik, Md Toufiq Hasan ; Danger, Jean-Luc ; Guilley, Sylvain.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 32 (2024) 5 - p. 911-924 , 2024

Link: https://doi.org/10.1109/..

6

PETIT: PUF-enabled trust evaluation framework for IoT netwo..:

Mehjabin, Suhee Sanjana ; Younis, Mohamed ; Tekeoglu, Ali...
Computer Networks. 254 (2024) - p. 110772 , 2024

Link: https://doi.org/10.1016/..

7

Impact of Process Mismatch and Device Aging on SR-Latch Bas..:

, In: Lecture Notes in Computer Science; Constructive Side-Channel Analysis and Secure Design,

Bahrami, Javad ; Ebrahimabadi, Mohammad ; Guilley, Sylvain.. - p. 177-196 , 2024

Link: https://doi.org/10.1007/..

8

Welcome Message from the Chairs:

, In: 2023 IEEE International Conference on Omni-layer Intelligent Systems (COINS),

Firouzi, Farshad ; Chakrabarty, Krishnendu ; Karimi, Naghmeh... - p. 1-1 , 2023

Link: https://doi.org/10.1109/..

9

Special Session: Security Verification & Testing for SR-Lat..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),

Bahrami, Javad ; Ebrahimabadi, Mohammad ; Danger, Jean-Luc.. - p. 1-10 , 2023

Link: https://doi.org/10.1109/..

10

Security Order of Gate-Level Masking Schemes:

, In: 2023 IEEE International Symposium on Hardware Oriented Security and Trust (HOST),

Takarabt, Sofiane ; Bahrami, Javad ; Ebrahimabadi, Mohammad.. - p. 57-67 , 2023

Link: https://doi.org/10.1109/..

11

Challenges in Generating True Random Numbers Considering th..:

, In: 2023 International Conference on IC Design and Technology (ICICDT),

Bahrami, Javad ; Danger, Jean-Luc ; Ebrahimabadi, Mohammad.. - p. 10-15 , 2023

Link: https://doi.org/10.1109/..

12

Testing and reliability enhancement of security primitives:..:

Anik, Md Toufiq Hasan ; Danger, Jean-Luc ; Diankha, Omar...
Microelectronics Reliability. 147 (2023) - p. 115055 , 2023

Link: https://doi.org/10.1016/..

13

A Networked System Dependability Validation Framework Using..:

Mehjabin, Suhee Sanjana ; Tekeoglu, Ali ; Younis, Mohamed...
IEEE Access. 11 (2023) - p. 127242-127254 , 2023

Link: https://doi.org/10.1109/..

14

Aging-Induced Failure Prognosis via Digital Sensors:

, In: Proceedings of the Great Lakes Symposium on VLSI 2023,

Anik, Md Toufiq Hasan ; Reefat, Hasin Ishraq ; Danger, Jean-Luc.. - p. 703-708 , 2023

Link: https://dl.acm.org/doi/1..

15

Collusion-resistant PUF-based Distributed Device Authentica..:

, In: GLOBECOM 2022 - 2022 IEEE Global Communications Conference,

Lalouani, Wassila ; Younis, Mohamed ; Ebrahimabadi, Mohammad. - p. 4328-4333 , 2022

Link: https://doi.org/10.1109/..