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Kastensmidt, F. Lima
71  Ergebnisse:
Personensuche X
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1

A study of the single event effects impact on functional ma..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Abate, F. ; Sterpone, L. ; Violante, M.. - p. 1226-1229 , 2009
Link: https://dl.acm.org/doi/1..
 
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2

Evaluating Different Solutions to Design Fault Tolerant Sys..:

Sterpone, L. ; Sonza Reorda, M. ; Violante, M...
Journal of Electronic Testing.  23 (2007)  1 - p. 47-54 , 2007
Link: https://doi.org/10.1007/..
 
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3

On the Optimal Design of Triple Modular Redundancy Logic fo..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 2,
Kastensmidt, F. Lima ; Sterpone, L. ; Carro, L.. - p. 1290-1295 , 2005
Link: https://dl.acm.org/doi/1..
 
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4

An automatic technique for optimizing Reed-Solomon codes to..:

Neuberger, G. ; de Lima Kastensmidt, F.G. ; Reis, R.
IEEE Design and Test of Computers.  22 (2005)  1 - p. 50-58 , 2005
Link: https://doi.org/10.1109/..
 
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5

Designing fault-tolerant techniques for SRAM-based FPGAs:

de Lima Kastensmidt, F.G. ; Neuberger, G. ; Hentschke, R.F...
IEEE Design and Test of Computers.  21 (2004)  6 - p. 552-562 , 2004
Link: https://doi.org/10.1109/..
 
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6

On the Optimal Design of Triple Modular Redundancy Logic fo..:

Kastensmidt, F. Lima ; Sterpone, L ; Carro, L.
http://arxiv.org/abs/0710.4688.  , 2007
Link: http://arxiv.org/abs/071..
 
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7

On the Optimal Design of Triple Modular Redundancy Logic fo..:

Kastensmidt, F. Lima ; Sterpone, L ; Carro, L.
info:eu-repo/semantics/altIdentifier/arxiv/0710.4688.  , 2005
Link: https://hal.archives-ouv..
 
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8

TID in a Mixed-Signal System-on-Chip: Analog Components Ana..:

, In: 2012 IEEE Radiation Effects Data Workshop,
Tambara, Lucas A. ; Kastensmidt, Fernanda Lima ; C.P.F., Evaldo... - p. 1-6 , 2012
Link: https://doi.org/10.1109/..
 
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9

Investigating the reliability impacts of neutron-induced so..:

Benevenuti, Fabio ; Gonçalves, Marcio ; Pereira, Evaldo Carlos F...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2022.114738.  , 2022
Link: https://hal.science/hal-..
 
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10

Investigating the reliability impacts of neutron-induced so..:

Benevenuti, Fabio ; Gonçalves, Marcio ; Pereira, Evaldo Carlos F...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2022.114738.  , 2022
Link: https://hal.science/hal-..
 
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11

Investigating the reliability impacts of neutron-induced so..:

Benevenuti, Fabio ; Gonçalves, Marcio ; Pereira, Evaldo Carlos F...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2022.114738.  , 2022
Link: https://hal.science/hal-..
 
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12

Assessing the Impacts of Radiation-induced Soft Errors on A..:

Benevenuti, F. ; Gobatto, L. ; Bastos, R. Possamai..
IEEE Transactions on Nuclear Science.  , 2024
Link: https://doi.org/10.1109/..
 
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13

Effects of thermal neutron radiation on a hardware-implemen..:

Garay Trindade, M. ; Benevenuti, F. ; Letiche, M....
Microelectronics Reliability.  116 (2021)  - p. 114022 , 2021
Link: https://doi.org/10.1016/..
 
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14

Circuit design using Schmitt Trigger to reliability improve..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability.  114 (2020)  - p. 113754 , 2020
Link: https://doi.org/10.1016/..
 
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15

Building ATMR circuits using approximate library and heuris..:

Albandes, I. ; Martins, M. ; Cuenca-Asensi, S..
Microelectronics Reliability.  97 (2019)  - p. 24-30 , 2019
Link: https://doi.org/10.1016/..
 
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