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Kastensmidt, Fernanda Lima
150  Ergebnisse:
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1

Fault tolerance techniques for SRAM based FPGAs 

Frontiers in electronic testing ; 32
Kastensmidt, Fernanda Lima ; Carro, Luigi , 2006
Exemplare:  :TB Technik n 274/363; Zentrale:Magazinturm E02 a elt 695 e/042
 
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2

Evaluating Fault-Tolerant Techniques on COTS RISC-V NOEL-V ..:

de Oliveira, Ádria Barros ; Kastensmidt, Fernanda Lima
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1708-1715 , 2023
Link: https://doi.org/10.1109/..
 
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3

Robust Convolutional Neural Networks in SRAM-based FPGAs: a..:

Benevenuti, Fabio ; Kastensmidt, Fernanda Lima ; Oliveira, Ádria Barros de...
Journal of Integrated Circuits and Systems.  16 (2021)  2 - p. 1-12 , 2021
Link: https://doi.org/10.29292..
 
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4

Investigating real-time control-flow error detection in har..:

Hoppe, Augusto ; Kastensmidt, Fernanda Lima ; Becker, Jürgen
Microelectronics Reliability.  126 (2021)  - p. 114264 , 2021
Link: https://doi.org/10.1016/..
 
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5

Neutron-induced Faults on CNN for Aerial Image Classificati..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Benevenuti, Fabio ; Goncalves, Marcio ; Junior, Evaldo Carlos Fonseca Pereira... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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6

Assessing the Reliability of Successive Approximate Computi..:

Rodrigues, Gennaro S. ; Barros de Oliveira, Ádria ; Kastensmidt, Fernanda Lima..
Journal of Electronic Testing.  35 (2019)  3 - p. 367-381 , 2019
Link: https://doi.org/10.1007/..
 
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7

Approximate TMR Based on Successive Approximation to Protec..:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Rodrigues, Gennaro Severino ; Kastensmidt, Fernanda Lima ; Pouget, Vincent. - p. 1-5 , 2018
Link: https://doi.org/10.1109/..
 
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8

Soft error susceptibility analysis methodology of HLS desig..:

Tonfat, Jorge ; Tambara, Lucas ; Santos, André.
Microprocessors and Microsystems.  51 (2017)  - p. 209-219 , 2017
Link: https://doi.org/10.1016/..
 
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9

Fault injection methodology for single event effects on clo..:

, In: 2017 18th IEEE Latin American Test Symposium (LATS),
Contreras Benites, Luis Alberto ; Kastensmidt, Fernanda Lima - p. 1-4 , 2017
Link: https://doi.org/10.1109/..
 
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10

Analyzing lockstep dual-core ARM cortex-A9 soft error mitig..:

, In: Proceedings of the 30th Symposium on Integrated Circuits and Systems Design: Chip on the Sands,
de Oliveira, Ádria Barros ; Rodrigues, Gennaro Severino ; Kastensmidt, Fernanda Lima - p. 84-89 , 2017
Link: https://dl.acm.org/doi/1..
 
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11

Latency Improvement with Traffic Flow Analysis in a 3D NoC ..:

, In: Proceedings of the 28th Symposium on Integrated Circuits and Systems Design,
Kologeski, Anelise ; Zanuz, Henrique Colao ; Kastensmidt, Fernanda Lima - p. 1-6 , 2015
Link: https://dl.acm.org/doi/1..
 
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12

Session details: SoC, NoC, Embedded:

, In: Proceedings of the 28th Symposium on Integrated Circuits and Systems Design,
Kastensmidt, Fernanda Lima , 2015
Link: https://dl.acm.org/doi/1..
 
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13

Application-Based Analysis of Register File Criticality for..:

Restrepo-Calle, Felipe ; Cuenca-Asensi, Sergio ; Martínez-Álvarez, Antonio..
Journal of Electronic Testing.  31 (2015)  2 - p. 139-150 , 2015
Link: https://doi.org/10.1007/..
 
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14

Exploring the use of approximate TMR to mask transient faul..:

Gomes, Iuri A.C. ; Martins, Mayler G.A. ; Reis, André I..
Microelectronics Reliability.  55 (2015)  9-10 - p. 2072-2076 , 2015
Link: https://doi.org/10.1016/..
 
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15

Laser Testing Methodology for Diagnosing Diverse Soft Error..:

Kastensmidt, Fernanda Lima ; Tambara, Lucas ; Bobrovsky, Dmitry V...
IEEE Transactions on Nuclear Science.  61 (2014)  6 - p. 3130-3137 , 2014
Link: https://doi.org/10.1109/..
 
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