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Katoh, Kentaroh
20  Ergebnisse:
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1

12 bit 1 ps Resolution Time-to-Digital Converter for LSI Te..:

, In: Proceedings of Eighth International Congress on Information and Communication Technology; Lecture Notes in Networks and Systems,
Iimori, Daisuke ; Nakatani, Takayuki ; Katayama, Shogo... - p. 217-227 , 2023
Link: https://doi.org/10.1007/..
 
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2

Low distortion sine wave generator with simple harmonics ca..:

Katayama, Shogo ; Nakatani, Takayuki ; Iimori, Daisuke...
IEICE Electronics Express.  20 (2023)  1 - p. 20220470-20220470 , 2023
Link: https://doi.org/10.1587/..
 
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3

Low Distortion Sinusoidal Signal Generator with Harmonics C..:

, In: 2023 IEEE International Test Conference (ITC),
Sato, Keno ; Nakatani, Takayuki ; Ishida, Takashi... - p. 47-55 , 2023
Link: https://doi.org/10.1109/..
 
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4

A Physically Unclonable Function Using Time-to-Digital Conv..:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Katoh, Kentaroh ; Yamamoto, Shuhei ; Zhao, Zheming... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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5

Design Consideration for LC Analog Filters: Inductor ESR Co..:

, In: Proceedings of Eighth International Congress on Information and Communication Technology; Lecture Notes in Networks and Systems,
Takagi, Misaki ; Nakatani, Takayuki ; Katayama, Shogo... - p. 155-166 , 2023
Link: https://doi.org/10.1007/..
 
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6

Innovative Practices Track: Innovative Analog Circuit Testi..:

, In: 2022 IEEE 40th VLSI Test Symposium (VTS),
Mangelsdorf, Chris ; Madhvaraj, Manasa ; Mir, Salvador... - p. 1-1 , 2022
Link: https://doi.org/10.1109/..
 
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7

Evaluation of Code Selective Histogram Algorithm For ADC Li..:

, In: 2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia),
Zhao, Yujie ; Katoh, Kentaroh ; Kuwana, Anna... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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8

High Precision Voltage Measurement System Utilizing Low-End..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Sato, Keno ; Nakatani, Takayuki ; Katayama, Shogo... - p. 37-42 , 2022
Link: https://doi.org/10.1109/..
 
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9

Revisit to Histogram Method for ADC Linearity Test: Examina..:

Zhao, Yujie ; Katoh, Kentaroh ; Kuwana, Anna...
Journal of Electronic Testing.  38 (2022)  1 - p. 21-38 , 2022
Link: https://doi.org/10.1007/..
 
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10

Challenges for Waveform Sampling and Related Technologies:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Kobayashi, Haruo ; Katoh, Kentaroh ; Yamamoto, Shuhei... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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11

A Small Chip Area Stochastic Calibration for TDC Using Ring..:

Katoh, Kentaroh ; Kobayashi, Yutaro ; Chujo, Takeshi...
Journal of Electronic Testing.  30 (2014)  6 - p. 653-663 , 2014
Link: https://doi.org/10.1007/..
 
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12

Erratum to: A Small Chip Area Stochastic Calibration for TD..:

Katoh, Kentaroh ; Kobayashi, Yutaro ; Chujo, Takeshi...
Journal of Electronic Testing.  31 (2014)  4 - p. 419-419 , 2014
Link: https://doi.org/10.1007/..
 
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13

Analog/mixed-signal circuit design in nano CMOS era:

Kobayashi, Haruo ; Aoki, Hitoshi ; Katoh, Kentaroh.
IEICE Electronics Express.  11 (2014)  3 - p. 20142001-20142001 , 2014
Link: https://doi.org/10.1587/..
 
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14

Design for Delay Fault Testability of Dual Circuits Using M..:

KATOH, Kentaroh ; NAMBA, Kazuteru ; ITO, Hideo
IEICE Transactions on Information and Systems.  E92-D (2009)  3 - p. 433-442 , 2009
Link: https://doi.org/10.1587/..
 
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15

Design for Delay Fault Testability of 2-Rail Logic Circuits:

KATOH, Kentaroh ; NAMBA, Kazuteru ; ITO, Hideo
IEICE Transactions on Information and Systems.  E92-D (2009)  2 - p. 336-341 , 2009
Link: https://doi.org/10.1587/..
 
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