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Kazemi Esfeh, Babak
104  Ergebnisse:
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1

Prediction of RF performances of advanced MOS transistors f..:

Maafri, Djabar ; Kazemi Esfeh, Babak ; Saadi, Abdelhalim..
Microwave and Optical Technology Letters.  60 (2018)  9 - p. 2256-2262 , 2018
Link: https://doi.org/10.1002/..
 
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2

Compact On-Wafer Test Structures for Device RF Characteriza..:

Kazemi Esfeh, Babak ; Ben Ali, Khaled ; Raskin, Jean-Pierre
IEEE Transactions on Electron Devices.  64 (2017)  8 - p. 3101-3107 , 2017
Link: https://doi.org/10.1109/..
 
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3

Extensive Electrical Characterization Methodology of Advanc..:

Kilchytska, Valeriya ; Makovejev, Sergej ; Esfeh, Babak Kazemi...
IEEE Journal of the Electron Devices Society.  9 (2021)  - p. 500-510 , 2021
Link: https://doi.org/10.1109/..
 
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4

Impact of gate to source/drain alignment on the static and ..:

Han, Qinghua ; Liu, Mingshan ; Esfeh, Babak Kazemi...
Solid-State Electronics.  169 (2020)  - p. 107817 , 2020
Link: https://doi.org/10.1016/..
 
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5

28-nm FD-SOI CMOS RF Figures of Merit Down to 4.2 K:

Nyssens, Lucas ; Halder, Arka ; Esfeh, Babak Kazemi...
IEEE Journal of the Electron Devices Society.  8 (2020)  - p. 646-654 , 2020
Link: https://doi.org/10.1109/..
 
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6

Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperature..:

Nyssens, Lucas ; Halder, Arka ; Esfeh, Babak Kazemi...
IEEE Journal of the Electron Devices Society.  8 (2020)  - p. 789-796 , 2020
Link: https://doi.org/10.1109/..
 
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7

Electrical characterization of advanced MOSFETs towards ana..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
Kilchytska, Valeriya ; Makovejev, Sergej ; Esfeh, Babak Kazemi... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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8

Extrinsic gate capacitance compact model for UTBB MOSFETs:

Martinez-Lopez, Andrea G ; Tinoco, Julio C ; Lezama, Gamaliel...
Semiconductor Science and Technology.  33 (2017)  1 - p. 015001 , 2017
Link: https://doi.org/10.1088/..
 
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9

Low‐cost wideband double‐layer microstrip coupled‐line dire..:

Esfeh, Babak Kazemi ; Raskin, Jean‐Pierre ; Van Moer, Wendy
Microwave and Optical Technology Letters.  56 (2014)  7 - p. 1570-1575 , 2014
Link: https://doi.org/10.1002/..
 
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10

Impact of gate to source/drain alignment on the static and ..:

Han, Qinghua ; Liu, Mingshan ; Kazemi Esfeh, Babak..
boreal:237900.  , 2020
Link: http://hdl.handle.net/20..
 
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11

Electrical characterization of advanced MOSFETs towards ana..:

Kilchytska, Valeriya ; Makovejev, Sergej ; Kazemi Esfeh, Babak...
boreal:235740.  , 2020
Link: http://hdl.handle.net/20..
 
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12

Impact of gate to source/drain alignment on the static and ..:

Han, Qinghua ; Liu, Mingshan ; Kazemi Esfeh, Babak..
boreal:237900.  , 2020
Link: http://hdl.handle.net/20..
 
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13

28-nm FD-SOI CMOS RF Figures of Merit Down to 4.2 K:

Nyssens, Lucas ; Halder, Arka ; Kazemi Esfeh, Babak...
boreal:232138.  , 2020
Link: http://hdl.handle.net/20..
 
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14

28-nm FD-SOI CMOS RF Figures of Merit Down to 4.2 K:

Nyssens, Lucas ; Halder, Arka ; Kazemi Esfeh, Babak...
boreal:232138.  , 2020
Link: http://hdl.handle.net/20..
 
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15

Electrical characterization of advanced MOSFETs towards ana..:

Kilchytska, Valeriya ; Makovejev, Sergej ; Kazemi Esfeh, Babak...
boreal:235740.  , 2020
Link: http://hdl.handle.net/20..
 
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