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Kedarnath, Balakrishnan
7  Ergebnisse:
Personensuche X
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1

Re-configurable embedded core test protocol:

, In: Proceedings of the 2004 Asia and South Pacific Design Automation Conference,
Wang, Seongmoon ; Chakradhar, Srimat T. ; Kedarnath, Balakrishnan - p. 234-237 , 2004
Link: https://dl.acm.org/doi/1..
 
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2

Test Access Mechanism in the Quad-Core AMD Opteron Micropro..:

Balakrishnan, Kedarnath J. ; Giles, Grady ; Wingfield, James
IEEE Design & Test of Computers.  26 (2009)  1 - p. 52-59 , 2009
Link: https://doi.org/10.1109/..
 
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3

Test cost reduction for SoC using a combined approach to te..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Zhou, Quming ; Balakrishnan, Kedarnath J. - p. 39-44 , 2007
Link: https://dl.acm.org/doi/1..
 
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4

Improving Linear Test Data Compression:

Balakrishnan, Kedarnath J. ; Touba, Nur A.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  14 (2006)  11 - p. 1227-1237 , 2006
Link: https://doi.org/10.1109/..
 
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5

Reconfigurable Linear Decompressors Using Symbolic Gaussian..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 2,
Balakrishnan, Kedarnath J. ; Touba, Nur A. - p. 1130-1135 , 2005
Link: https://dl.acm.org/doi/1..
 
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6

Matrix-based software test data decompression for systems-o..:

Balakrishnan, Kedarnath ; Touba, Nur A.
Journal of Systems Architecture.  50 (2004)  5 - p. 247-256 , 2004
Link: https://doi.org/10.1016/..
 
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7

Reconfigurable Linear Decompressors Using Symbolic Gaussian..:

Balakrishnan, Kedarnath J ; Touba, Nur A
hal-00181284.  , 2005
Link: https://hal.archives-ouv..
 
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