Keksel A
30  Ergebnisse:
Personensuche X
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1

Bayesian analysis of uncertainties in circle, straight-line..:

Keksel, A ; Eli, B ; Eifler, M.
Surface Topography: Metrology and Properties.  12 (2024)  1 - p. 015015 , 2024
 
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2

Virtual topography measurement with transfer functions deri..:

Keksel, A ; Lohfink, A P ; Eifler, M..
Measurement Science and Technology.  31 (2020)  5 - p. 055008 , 2020
 
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3

A model of confocal microscopy measurements combining empir..:

Keksel, A ; Eifler, M ; Seewig, J
Measurement Science and Technology.  32 (2020)  2 - p. 025008 , 2020
 
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5

Modeling of topography measuring instrument transfer functi..:

Keksel, A ; Eifler, M ; Seewig, J
Measurement Science and Technology.  29 (2018)  9 - p. 095012 , 2018
 
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6

Interrelationship of Manufacturing, Surface Morphology, and..:

, In: Component Surfaces; Springer Series in Advanced Manufacturing,
 
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8

Entwicklung intelligenter, kommunikationsfähiger Komponente:

, In: Entwicklung datenbasierter Produkt-Service Systeme,
Sivasothy, Paaranan ; Bechev, Dani ; Brehm, Horst... - p. 31-44 , 2019
 
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9

Anwendungsfall GRIMME:

, In: Entwicklung datenbasierter Produkt-Service Systeme,
Sivasothy, Paaranan ; Aurich, Jan C. ; Bechev, Dani... - p. 109-168 , 2019
 
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10

Comparison of material measures for the determination of tr..:

Eifler, Matthias ; Keksel, Andrej ; Seewig, Jörg
Surface Topography: Metrology and Properties.  7 (2019)  1 - p. 015024 , 2019
 
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11

Anwendungsfall BHN/Lenze/Schaeffler:

, In: Entwicklung datenbasierter Produkt-Service Systeme,
Olivotti, Daniel ; Apostolov, Hristo ; Bechev, Dani... - p. 185-230 , 2019
 
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