Keum, Dongmin
17  Ergebnisse:
Personensuche X
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3

Energy-Dependent Degradation Characteristics of AlGaN/GaN M..:

Keum, Dongmin ; Kim, Hyungtak
ECS Journal of Solid State Science and Technology.  7 (2018)  9 - p. Q159-Q163 , 2018
 
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6

Degradation Characteristics of AlGaN/GaN MOS-Heterostructur..:

Keum, Dongmin ; Cho, Geunho ; Kim, Hyungtak
ECS Journal of Solid State Science and Technology.  6 (2017)  11 - p. S3030-S3033 , 2017
 
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11

Proton Irradiation Effects on the Time-Dependent Dielectric..:

Keum, Dongmin ; Kim, Hyungtak
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6915387/.  , 2019
 
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