Keys, P.
434  Ergebnisse:
Personensuche X
?
1

High Volume Electrical Characterization of Semiconductor Qu..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Pillarisetty, R. ; Kashani, N. ; Keys, P.... - p. 31.5.1-31.5.4 , 2019
 
?
2

State-of-the-art TCAD: 25 years ago and today:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Stettler, M. ; Slepko, A. ; Smith, S.... - p. 39.1.1-39.1.4 , 2019
 
?
 
?
4

On becoming expert in the use of problem structuring method:

Keys, P
Journal of the Operational Research Society.  57 (2006)  7 - p. 822-829 , 2006
 
?
5

On Becoming Expert in the Use of Problem Structuring Method:

Keys, P.
The Journal of the Operational Research Society.  57 (2006)  7 - p. 822-829 , 2006
 
?
6

Part Special Issue Editorial: The process of OR:

Keys, P ; Midgley, G
Journal of the Operational Research Society.  53 (2002)  2 - p. 123-125 , 2002
 
?
7

Creativity, design and style in MS/OR:

Keys, P
Omega.  28 (2000)  3 - p. 303-312 , 2000
 
?
8

Series resistance limits for 0.05μm MOSFETs:

Keys, P. ; Gossmann, H.-J. ; Ng, K.K..
Superlattices and Microstructures.  27 (2000)  2-3 - p. 125-136 , 2000
 
?
10

OR groups and the professionalisation of OR:

Keys, P
Journal of the Operational Research Society.  49 (1998)  4 - p. 347-354 , 1998
 
?
11

OR as technology revisited:

Keys, P
Journal of the Operational Research Society.  49 (1998)  2 - p. 99-108 , 1998
 
?
12

OR Groups and the Professionalisation of OR:

Keys, P.
The Journal of the Operational Research Society.  49 (1998)  4 - p. 347 , 1998
 
?
13

OR groups and the professionalisation of OR:

Keys, P
Journal of the Operational Research Society.  49 (1998)  4 - p. 347-354 , 1998
 
?
14

OR as Technology Revisited:

Keys, P.
The Journal of the Operational Research Society.  49 (1998)  2 - p. 99 , 1998
 
?
15

OR as Technology Revisited:

Keys, P.
The Journal of the Operational Research Society.  49 (1998)  2 - p. 99-108 , 1998
 
1-15
Mehr Literatur finden