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Kilchytska, Valeriya
177  Ergebnisse:
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1

Analysis of trap distribution and NBTI degradation in Al2O3..:

Yan, Yiyi ; Kilchytska, Valeriya ; Flandre, Denis.
Solid-State Electronics.  207 (2023)  - p. 108675 , 2023
Link: https://doi.org/10.1016/..
 
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2

Impact of thermal coupling effects on the digital and analo..:

Vanbrabant, Martin ; Raskin, Jean-Pierre ; Flandre, Denis.
Solid-State Electronics.  202 (2023)  - p. 108623 , 2023
Link: https://doi.org/10.1016/..
 
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3

Charge-pumping characterization of SOI devices fabricated b..:

Głuszko, Grzegorz ; Łukasiak, Lidia ; Kilchytska, Valeriya...
Journal of Telecommunications and Information Technology.  , 2023
Link: https://doi.org/10.26636..
 
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4

Variance and Skewness of Current Fluctuations Experimentall..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
Van Brandt, Leopold ; Vercauteren, Roselien ; Enriquez, Diego Haya... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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5

Impact of High Temperature Up to 175 °C on the DC and RF Pe..:

Halder, Arka ; Nyssens, Lucas ; Vanbrabant, Martin...
IEEE Transactions on Electron Devices.  70 (2023)  10 - p. 4987-4992 , 2023
Link: https://doi.org/10.1109/..
 
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6

Comparison of Heat Sinks in Back-End of Line to reduce Self..:

Halder, Arka ; Nyssens, Lucas ; Lederer, Dimitri..
Solid-State Electronics.  207 (2023)  - p. 108706 , 2023
Link: https://doi.org/10.1016/..
 
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7

Improved self-heating extraction with RF technique at cryog..:

Vanbrabant, Martin ; Raskin, Jean-Pierre ; Kilchytska, Valeriya
Solid-State Electronics.  207 (2023)  - p. 108708 , 2023
Link: https://doi.org/10.1016/..
 
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8

Investigation and optimization of traps properties in Al2O3..:

Yan, Yiyi ; Kilchytska, Valeriya ; Flandre, Denis.
Solid-State Electronics.  194 (2022)  - p. 108347 , 2022
Link: https://doi.org/10.1016/..
 
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9

Experimental study of thermal coupling effects in FD-SOI MO..:

Vanbrabant, Martin ; Raskin, Jean-Pierre ; Flandre, Denis.
Solid-State Electronics.  194 (2022)  - p. 108362 , 2022
Link: https://doi.org/10.1016/..
 
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10

22 nm FD-SOI MOSFET Figures of Merit at high temperatures u..:

, In: 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF),
Halder, Arka ; Nyssens, Lucas ; Rack, Martin... - p. 27-30 , 2022
Link: https://doi.org/10.1109/..
 
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11

Characterization of thin Al2O3/SiO2 dielectric stack for CM..:

Yan, Yiyi ; Kilchytska, Valeriya ; Wang, Bin...
Microelectronic Engineering.  254 (2022)  - p. 111708 , 2022
Link: https://doi.org/10.1016/..
 
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12

Heat sink implementation in back-end of line for self-heati..:

Halder, Arka ; Nyssens, Lucas ; Rack, Martin...
Solid-State Electronics.  184 (2021)  - p. 108088 , 2021
Link: https://doi.org/10.1016/..
 
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13

Extensive Electrical Characterization Methodology of Advanc..:

Kilchytska, Valeriya ; Makovejev, Sergej ; Esfeh, Babak Kazemi...
IEEE Journal of the Electron Devices Society.  9 (2021)  - p. 500-510 , 2021
Link: https://doi.org/10.1109/..
 
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14

Assessment of RF compact modelling of FD SOI transistors:

, In: 2021 IEEE Latin America Electron Devices Conference (LAEDC),
Vanbrabant, Martin ; Nyssens, Lucas ; Kilchytska, Valeriya. - p. 1-3 , 2021
Link: https://doi.org/10.1109/..
 
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15

Determination of Carrier Lifetime in Silicon Using an Ultra..:

, In: 2021 IEEE Latin America Electron Devices Conference (LAEDC),
Yan, Yiyi ; Flandre, Denis ; Kilchytska, Valeriya... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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