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Kim, Bruce
5999  Ergebnisse:
Personensuche X
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1

Advanced Nano Packaging for Silicon Nanowire Sensors:

, In: 2024 IMAPS Nordic Conference on Microelectronics Packaging (NordPac),
Selvarathinam, Thambiraj ; Kim, Bruce ; Lee, Jeong H.. - p. 1-5 , 2024
Link: https://doi.org/10.23919..
 
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2

Developing Nanosensors with Silicon Nanowires*:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Kim, Bruce ; Aleem, Mahaboobbatcha ; Kundu, Sharmistha. - p. 1066-1069 , 2023
Link: https://doi.org/10.1109/..
 
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3

Functionalized ZnO Nanowires for Biosensing Applications:

, In: 2023 IEEE 16th International Conference on Nano/Molecular Medicine & Engineering (NANOMED),
Kim, Bruce ; Gupta, Anurag ; Thambiraj, S... - p. 214-217 , 2023
Link: https://doi.org/10.1109/..
 
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4

Multifunctional Gold Nanoformulations for Prostate Cancer D..:

, In: 2023 IEEE 16th International Conference on Nano/Molecular Medicine & Engineering (NANOMED),
Selvarathinam, Thambiraj ; Kim, Bruce ; Lee, Jeong H.. - p. 125-130 , 2023
Link: https://doi.org/10.1109/..
 
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5

Reliable Fabrication Techniques of SiNW Based Nanosensors:

, In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC),
Kim, Bruce ; Aleem, M. ; Selvarathinam, T.... - p. 595-599 , 2023
Link: https://doi.org/10.1109/..
 
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6

Training a Machine Learning Model for Underwater Chemical S..:

, In: OCEANS 2022, Hampton Roads,
Phan, Hau ; Wardlaw, Michael J. ; Kim, Bruce. - p. 1-10 , 2022
Link: https://doi.org/10.1109/..
 
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7

Embedded RF Circuit Diagnostic Technique with Multi-Tone Di..:

Kannan, Sukeshwar ; Kim, Bruce ; Srinivasan, Ganesh...
Journal of Electronic Testing.  27 (2011)  3 - p. 241-252 , 2011
Link: https://doi.org/10.1007/..
 
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8

Fault Modeling and Multi-Tone Dither Scheme for Testing 3D ..:

Kannan, Sukeshwar ; Kim, Bruce ; Ahn, Byoungchul
Journal of Electronic Testing.  28 (2011)  1 - p. 39-51 , 2011
Link: https://doi.org/10.1007/..
 
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9

Test Technology Newsletter - October 2007: The Newsletter o..:

Kim, Bruce
Journal of Electronic Testing.  23 (2007)  5 - p. 371-372 , 2007
Link: https://doi.org/10.1007/..
 
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10

Test Technology Newsletter - December 2007: The Newsletter ..:

Kim, Bruce
Journal of Electronic Testing.  23 (2007)  6 - p. 467-468 , 2007
Link: https://doi.org/10.1007/..
 
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11

Test Technology Newsletter April 2007: The Newsletter of th..:

Kim, Bruce
Journal of Electronic Testing.  23 (2007)  2-3 - p. 113-114 , 2007
Link: https://doi.org/10.1007/..
 
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12

TTTC Newsletter:

Kim, Bruce
IEEE Design and Test of Computers.  23 (2006)  6 - p. 507-507 , 2006
Link: https://doi.org/10.1109/..
 
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13

The Newsletter of Test Technology Council of the IEEE Compu..:

Kim, Bruce
Journal of Electronic Testing.  21 (2005)  5 - p. 461-462 , 2005
Link: https://doi.org/10.1007/..
 
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14

MEMS spring probe for non-destructive wafer level chip test:

Lee, Keekeun ; Kim, Bruce
Journal of Micromechanics and Microengineering.  15 (2005)  5 - p. 953-957 , 2005
Link: https://doi.org/10.1088/..
 
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15

Polyimide based neural implants with stiffness improvement:

Lee, Keekeun ; Singh, Amarjit ; He, Jiping...
Sensors and Actuators B: Chemical.  102 (2004)  1 - p. 67-72 , 2004
Link: https://doi.org/10.1016/..
 
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