Kim, Hyungtak
200  Ergebnisse:
Personensuche X
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6

Analysis of Hot Carrier Degradation in 0.25-μm Schottky Gat..:

Cho, Seong-In ; Jang, Won-Ho ; Cha, Ho-Young.
Journal of Electromagnetic Engineering and Science.  22 (2022)  3 - p. 291-295 , 2022
 
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Deep-Ultraviolet Thermoreflectance Thermal Imaging of GaN H..:

, In: 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm),
 
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