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Kim, Iljeok
8  Ergebnisse:
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1

Deep Feature Selection Framework for Quality Prediction in ..:

Kim, Iljeok ; Na, Juwon ; Yun, Jong Pil.
IEEE Transactions on Industrial Informatics.  20 (2024)  1 - p. 503-512 , 2024
Link: https://doi.org/10.1109/..
 
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2

Single domain generalizable and physically interpretable be..:

Kim, Iljeok ; Wook Kim, Sung ; Kim, Jeongsan...
Expert Systems with Applications.  241 (2024)  - p. 122455 , 2024
Link: https://doi.org/10.1016/..
 
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3

Simulation-driven Bearing Fault Diagnosis for Condition Mon..:

Kim, Iljeok ; Lee, Seungchul
PHM Society Asia-Pacific Conference.  4 (2023)  1 - p. , 2023
Link: https://doi.org/10.36001..
 
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4

Wafer map failure pattern classification using geometric tr..:

Jeong, Iljoo ; Lee, Soo Young ; Park, Keonhyeok...
Scientific Reports.  13 (2023)  1 - p. , 2023
Link: https://doi.org/10.1038/..
 
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5

Knowledge Integration into deep learning in dynamical syste..:

Kim, Sung Wook ; Kim, Iljeok ; Lee, Jonghwan.
Journal of Mechanical Science and Technology.  35 (2021)  4 - p. 1331-1342 , 2021
Link: https://doi.org/10.1007/..
 
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6

Modulation of saliva pattern and accurate detection of ovul..:

Lee, Eunji ; Kim, Iljeok ; Nam, Hyoryung..
The Analyst.  145 (2020)  5 - p. 1716-1723 , 2020
Link: https://doi.org/10.1039/..
 
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7

Wafer map failure pattern classification using geometric tr..:

Jeong, Iljoo ; Lee, Soo Young ; Park, Keonhyeok...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10199043/.  , 2023
Link: http://www.ncbi.nlm.nih...
 
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8

Wafer map failure pattern classification using geometric tr..:

Iljoo Jeong ; Soo Young Lee ; Keonhyeok Park...
https://doi.org/10.1038/s41598-023-34147-2.  , 2023
Link: https://doi.org/10.1038/..
 
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