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2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Drain Current Degradation Induced by Charge Trapping/De-Tra..:
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2023 International Electron Devices Meeting (IEDM) ,
6
Comprehensive Design Guidelines of Gate Stack for QLC and H..:
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2022 International Electron Devices Meeting (IEDM) ,
7
Design Guidelines of Thermally Stable Hafnia Ferroelectrics..:
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2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) ,
15