Kim, Raseong
24  Ergebnisse:
Personensuche X
?
2

Channel Material Benchmarking of Si and Ge n- and pMOSFETs ..:

Kim, Raseong ; Young, Ian A.
IEEE Transactions on Electron Devices.  70 (2023)  8 - p. 4014-4021 , 2023
 
?
5

Comprehensive n- and pMOSFET Channel Material Benchmarking ..:

Kim, Raseong ; Avci, Uygar E. ; Young, Ian A.
IEEE Journal of the Electron Devices Society.  8 (2020)  - p. 505-523 , 2020
 
1-15