Kim, Soonkon
8  Ergebnisse:
Personensuche X
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3

Effect of PECVD Gate SiO2 Thickness on the Poly-Si/SiO2 Int..:

Park, Jungmin ; Choi, Pyungho ; Kim, Soonkon...
Journal of Electrical Engineering & Technology.  16 (2021)  2 - p. 1027-1033 , 2021
 
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5

P‐8: Degradation Model of LTPS TFT Aged off‐State Bias Stre..:

Kim, Kihwan ; Kim, Hyojung ; Song, Minjun...
SID Symposium Digest of Technical Papers.  51 (2020)  1 - p. 1338-1341 , 2020
 
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