Kimi, Yuta
10  Ergebnisse:
Personensuche X
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1

Time-Dependent Degradation in Device Characteristics and Co..:

, In: VLSI Design and Test for Systems Dependability,
 
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2

Design of SRAM Resilient Against Dynamic Voltage Variations:

, In: VLSI Design and Test for Systems Dependability,
Yoshimoto, Masahiko ; Nakata, Yohei ; Kimi, Yuta... - p. 579-591 , 2018
 
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3

Error Propagation Analysis for Single Event Upset consideri..:

MATSUKAWA, Go ; KIMI, Yuta ; YOSHIDA, Shuhei...
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.  E99.A (2016)  6 - p. 1198-1205 , 2016
 
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4

A Low-Latency DMR Architecture with Fast Checkpoint Recover..:

MATSUKAWA, Go ; NAKATA, Yohei ; SUGURE, Yasuo...
IEICE Transactions on Electronics.  E98.C (2015)  4 - p. 333-339 , 2015
 
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5

A 40-nm Resilient Cache Memory for Dynamic Variation Tolera..:

NAKATA, Yohei ; KIMI, Yuta ; OKUMURA, Shunsuke...
IEICE Transactions on Electronics.  E97.C (2014)  4 - p. 332-341 , 2014
 
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7

Morc1 reestablishes H3K9me3 heterochromatin on piRNA-target..:

Uneme, Yuta ; Maeda, Ryu ; Nakayama, Gen...
Proceedings of the National Academy of Sciences.  121 (2024)  13 - p. , 2024
 
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9

Development of "Comparison Task" to Measure Intellectual Co..:

, In: Proceedings of the 2016 International Conference on Communication and Information Systems,
Ueda, Kimi ; Tsuji, Yuta ; Shimoda, Hiroshi... - p. 58-64 , 2016
 
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