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2023 International Electron Devices Meeting (IEDM) ,
3
Reliability Assessment of Double-Gated Wafer-Scale MoS2 Fie..:
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2022 International Electron Devices Meeting (IEDM) ,
5
Gate length scaling beyond Si: Mono-layer 2D Channel FETs R..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
7