Kiyota, Yukihiro
31  Ergebnisse:
Personensuche X
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1

94-GHz fT, 0.4-dB NFmin HBT with Optimized Si Cap and Extri..:

Kiyota, Yukihiro ; Yamagata, Hideo ; Bairo, Masaaki...
Japanese Journal of Applied Physics.  44 (2005)  4S - p. 2739 , 2005
 
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2

Evaluation of Crystalline Defects in Thin, Strained Silicon..:

, In: Rapid Thermal Processing for Future Semiconductor Devices,
Kiyota, Yukihiro ; Takeda, Kazuo - p. 69-74 , 2003
 
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4

H 2 Cleaning of Silicon Wafers before Low‐Temperature Epita..:

Oda, Katsuya ; Kiyota, Yukihiro
Journal of The Electrochemical Society.  143 (1996)  7 - p. 2361-2364 , 1996
 
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7

Phosphorus Direct Doping from Vapor Phase into Silicon for ..:

Kiyota, Yukihiro ; Nakamura, Tohru ; Muraki, Kazuhiko.
Journal of The Electrochemical Society.  141 (1994)  8 - p. 2241-2244 , 1994
 
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10

Characteristics of Shallow Boron‐Doped Layers in Si by Rapi..:

Kiyota, Yukihiro ; Nakamura, Tohru ; Inada, Taroh..
Journal of The Electrochemical Society.  140 (1993)  4 - p. 1117-1121 , 1993
 
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11

Oxidation Properties of Silicon Nitride Thin Films Fabricat..:

Kato, Isamu ; Numada, Kouji ; Kiyota, Yukihiro
Japanese Journal of Applied Physics.  27 (1988)  8R - p. 1401 , 1988
 
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12

Quantitative 31P-NMR for the Purity Determination of the Or..:

Uchiyama, Nahoko ; Hosoe, Junko ; Komatsu, Takanori...
Chemical and Pharmaceutical Bulletin.  72 (2024)  1 - p. 36-40 , 2024
 
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15

Quantitative 31P-NMR for Purity Determination of Sofosbuvir..:

Uchiyama, Nahoko ; Kiyota, Kohei ; Hosoe, Junko...
Chemical and Pharmaceutical Bulletin.  70 (2022)  12 - p. 892-900 , 2022
 
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