E-LIB Suche - Ergebnisse für: Kolmakov, Andrei

1

Operando XPS for Plasma Process Monitoring: A Case Study on..:

Diulus, J. Trey ; Naclerio, Andrew E. ; Boscoboinik, Jorge Anibal...
The Journal of Physical Chemistry C. 128 (2024) 18 - p. 7591-7600 , 2024

Link: https://doi.org/10.1021/..

2

Operando photoelectron spectromicroscopy of nanodevices: Co..:

Kolmakov, Andrei ; Diulus, J. Trey ; Benkstein, Kurt D....
Journal of Electron Spectroscopy and Related Phenomena. 266 (2023) - p. 147366 , 2023

Link: https://doi.org/10.1016/..

3

Dependence of Single‐Wall Carbon Nanotube Alignment on the ..:

Walker, Joshua S. ; Macdermid, Zia J. ; Fagan, Jeffrey A....
Small. 18 (2022) 11 - p. , 2022

Link: https://doi.org/10.1002/..

4

Scanning Electron Microscopy to Study the Nucleation and Gr..:

Kolmakov, Andrei ; Raciti, David
Journal of The Electrochemical Society. 169 (2022) 11 - p. 112510 , 2022

Link: https://doi.org/10.1149/..

5

Comparative Operando XPS and SEM Spatiotemporal Potential M..:

Suzer, Sefik ; Strelcov, Evgheni ; Kolmakov, Andrei
Analytical Chemistry. 93 (2021) 39 - p. 13268-13273 , 2021

Link: https://doi.org/10.1021/..

6

Electron Beam Printed Hydrogels as a Hydration Source for G..:

Arble, Chris ; Kolmakov, Andrei
Microscopy and Microanalysis. 27 (2021) S1 - p. 2240-2241 , 2021

Link: https://doi.org/10.1017/..

7

Spatially Resolved Potential and Li-Ion Distributions Revea..:

Fuller, Elliot J. ; Strelcov, Evgheni ; Weaver, Jamie L....
ACS Energy Letters. 6 (2021) 11 - p. 3944-3951 , 2021

Link: https://doi.org/10.1021/..

8

Combining secondary ion mass spectrometry image depth profi..:

Johnson, Monique E. ; Bennett, Joe ; Montoro Bustos, Antonio R....
Analytica Chimica Acta. 1175 (2021) - p. 338671 , 2021

Link: https://doi.org/10.1016/..

9

Addressable graphene encapsulation of wet specimens on a ch..:

Arble, Christopher ; Guo, Hongxuan ; Matruglio, Alessia...
Lab on a Chip. 21 (2021) 23 - p. 4618-4628 , 2021

Link: https://doi.org/10.1039/..

10

Nanoscale Mapping of the Double Layer Potential at the Grap..:

Strelcov, Evgheni ; Arble, Christopher ; Guo, Hongxuan...
Nano Letters. 20 (2020) 2 - p. 1336-1344 , 2020

Link: https://doi.org/10.1021/..

11

Electron and X-ray Focused Beam-Induced Cross-Linking in Li..:

Gupta, Tanya ; Strelcov, Evgheni ; Holland, Glenn...
ACS Nano. 14 (2020) 10 - p. 12982-12992 , 2020

Link: https://doi.org/10.1021/..

12

Operando Scanning Electron and Microwave Microscopies in Pl..:

Kolmakov, Andrei ; Tselev, Alexander
Microscopy and Microanalysis. 26 (2020) S2 - p. 2498-2499 , 2020

Link: https://doi.org/10.1017/..

13

Probing Electrified Liquid–Solid Interfaces with Scanning E..:

Guo, Hongxuan ; Yulaev, Alexander ; Strelcov, Evgheni...
ACS Applied Materials & Interfaces. 12 (2020) 50 - p. 56650-56657 , 2020

Link: https://doi.org/10.1021/..

14

Radiation damage of liquid electrolyte during focused X-ray..:

Arble, Christopher ; Guo, Hongxuan ; Strelcov, Evgheni...
Surface Science. 697 (2020) - p. 121608 , 2020

Link: https://doi.org/10.1016/..

15

Graphene Membrane Encapsulation Platform for Multi-techniqu..:

Arble, Christopher ; Guo, Hongxuan ; Matruglio, Alessia..
Microscopy and Microanalysis. 26 (2020) S2 - p. 2228-2229 , 2020

Link: https://doi.org/10.1017/..