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1

Eine rechnergestützte Entwurfsraumexploration für fehlert..:

Scharoba, Stefan , 2024

Link: https://nbn-resolving.or..

2

Investigation of sensitivity of different logic and memory ..:

Petryk, Dmytro , 2024

Link: https://nbn-resolving.de..

3

On the Influence of Cell Libraries and Other Parameters to ..:

, In: 2024 13th Mediterranean Conference on Embedded Computing (MECO),

Dyka, Zoya ; Kabin, Ievgen ; Brzozowski, Marcin... - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

4

Test Cost Reduction for VLSI Adaptive Test With K-Nearest N..:

Song, Tai ; Huang, Zhengfeng ; Zhang, Li...
IEEE Transactions on Circuits and Systems II: Express Briefs. 71 (2024) 7 - p. 3508-3512 , 2024

Link: https://doi.org/10.1109/..

5

Simulation-Based Analysis and Modeling of Generated Single ..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),

Andjelkovic, Marko ; Krstic, Milos - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

6

Design and analysis of an adaptive radiation resilient RRAM..:

Reiser, Daniel ; Chen, Junchao ; Knödtel, Johannes...
Design Automation for Embedded Systems. , 2024

Link: https://doi.org/10.1007/..

7

Real-time Wideband Video Synchronization via an Analog QPSK..:

, In: 2024 IEEE Space Hardware Radio Conference (SHaRC),

Wormann, Janis ; Manoliu, Laura ; Haussmann, Simon.. - p. 23-26 , 2024

Link: https://doi.org/10.1109/..

8

Sustainability, Sociodemographic Differences, and Consumer ..:

Topić, Martina ; Kostopoulos, Ioannis ; Krstić, Miloš
American Behavioral Scientist. , 2024

Link: https://doi.org/10.1177/..

9

FPGA Implementation of a Fault-Tolerant Fused and Branched ..:

Syed, Rizwan Tariq ; Zhao, Yanhua ; Chen, Junchao...
IEEE Access. 12 (2024) - p. 57847-57862 , 2024

Link: https://doi.org/10.1109/..

10

Cycle-Accurate FPGA Emulation of RRAM Crossbar Array: Effic..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),

Wen, Jianan ; Vargas, Fabian Luis ; Zhu, Fukun... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

11

Silicon Lifecycle Management Based on On-Chip Cross-Layer S..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),

Vargas, Fabian ; Krstic, Milos ; Andjelkovic, Marko.. - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

12

Cross-Layer Reliability Analysis of NVDLA Accelerators: Exp..:

, In: 2024 IEEE European Test Symposium (ETS),

Veronesi, Alessandro ; Nazzari, Alessandro ; Passarello, Dario... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

13

Aging and Soft Error Resilience in Reconfigurable CNN Accel..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),

Syed, Rizwan Tariq ; Vargas, Fabian Luis ; Andjelkovic, Marko.. - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

14

A Holistic Approach for Characterization of SET Effects in ..:

, In: 2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS),

Andjelkovic, Marko ; Krstic, Milos - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

15

Toward Critical Flip-Flop Identification for Soft-Error Tol..:

Lu, Li ; Chen, Junchao ; Ulbricht, Markus.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 43 (2024) 4 - p. 1135-1148 , 2024

Link: https://doi.org/10.1109/..

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