Kteyan, A.
24  Ergebnisse:
Personensuche X
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1

A Novel Method for the Determination of Electromigration-In..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Shuster-Passage, J. ; Razek, S. Abdel ; Mattoo, M.... - p. 10A.4-1-10A.4-6 , 2024
 
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2

A Unified Physics-Based Stochastic Model for EM-Induced Res..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Sukharev, V. ; Choy, J.-H. ; Kteyan, A.... - p. 1-10 , 2024
 
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3

Novel methodology for temperature-aware electromigration as..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Kteyan, A. ; Sukharev, V. ; Yi, Y.. - p. 1-10 , 2022
 
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5

Epilepsy care in Armenia. Data of 3382 consecutive epilepti..:

Yeghiazaryan, N.S. ; Khechumyan, Z. ; Kteyan, A....
Journal of the Neurological Sciences.  333 (2013)  - p. e55-e56 , 2013
 
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6

Optimization of magnetron deposition process for formation ..:

Arakelova, E. R. ; Khachatryan, A. M. ; Avjyan, K. E..
Journal of Contemporary Physics (Armenian Academy of Sciences).  47 (2012)  4 - p. 181-188 , 2012
 
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7

Electronic polarizability of superconductors and inertial m..:

Kteyan, A. A. ; Vardanyan, R. A.
The European Physical Journal B - Condensed Matter and Complex Systems.  48 (2005)  4 - p. 433-437 , 2005
 
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9

Auger recombination involving dislocations in semiconductor:

Kteyan, A A ; Musayelyan, A S ; Vardanyan, R A
Journal of Physics: Condensed Matter.  15 (2003)  49 - p. 8445-8453 , 2003
 
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11

Electronic Damping of Dislocations and Kinetic Phenomena in..:

Kteyan, A. A. ; Vardanian, R. A.
Journal of Low Temperature Physics.  109 (1997)  1-2 - p. 369-396 , 1997
 
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12

Warpage Study by Employing an Advanced Simulation Methodolo..:

, In: Proceedings of the 2024 International Symposium on Physical Design,
 
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13

Electromigration Test Chip Experiments from Realistic Power..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Yi, Yong Hyeon ; Kim, Chris ; Kteyan, Armen... - p. 01-06 , 2024
 
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14

Electromigration Assessment in Power Grids with Account of ..:

, In: Proceedings of the 2023 International Symposium on Physical Design,
 
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15

Studying the Impact of Temperature Gradient on Electromigra..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Yi, Yong Hyeon ; Kim, Chris ; Zhou, Chen.. - p. 1-5 , 2023
 
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