Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Kumar, Navjeet
93  Ergebnisse:
Personensuche X
?
1

IoT Based Smart Charger : An ESP8266 Based Automatic Cha..:

, In: Proceedings of the International Conference on Big Data and Internet of Thing,
Kumar, Navjeet ; Sundaram, K. Meenakshi ; Anusuya - p. 153-157 , 2017
Link: https://dl.acm.org/doi/1..
 
?
2

Delirium in Immediate Postoperative Period in a Patient Ope..:

Ragi Jain ; Ankita Agarwal ; and Kumar Navjeet
http://medcraveonline.com/JACCOA/JACCOA-08-00314.pdf.  , 2017
Link: http://medcraveonline.co..
 
?
3

Erratum: Stem Rot of Pearl Millet Prevalence, Symptomatolog..:

Malik, Vinod Kumar ; Sangwan, Pooja ; Singh, Manjeet...
The Plant Pathology Journal.  40 (2024)  2 - p. 233-233 , 2024
Link: https://doi.org/10.5423/..
 
?
4

B2O3–TeO2–ZnO–Na2O–Nd2O3 glass matrices: A comprehensive st..:

Arora, Ritika ; Kaur, Navjeet ; Singh, Harpreet...
Materials Chemistry and Physics.  313 (2024)  - p. 128783 , 2024
Link: https://doi.org/10.1016/..
 
?
5

Assessment of the Biosensing Capabilities of SiGe Heterojun..:

Singh, Shailendra ; Agnihotri, Suneet Kumar ; Bagga, Navjeet.
ACS Applied Bio Materials.  7 (2024)  2 - p. 812-826 , 2024
Link: https://doi.org/10.1021/..
 
?
6

Stem Rot of Pearl Millet Prevalence, Symptomatology, Diseas..:

Malik, Vinod Kumar ; Sangwan, Pooja ; Singh, Manjeet...
The Plant Pathology Journal.  40 (2024)  1 - p. 48-58 , 2024
Link: https://doi.org/10.5423/..
 
?
7

Unveiling the Role of Interface and Dielectric Wall Traps w..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Rathore, Sunil ; Kumar, Sandeep ; Shakir, Mohd... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
?
8

Unveiling the reliability of negative capacitance FinFET wi..:

Kumar Jaisawal, Rajeewa ; Rathore, Sunil ; Kondekar, P.N..
Solid-State Electronics.  215 (2024)  - p. 108896 , 2024
Link: https://doi.org/10.1016/..
 
?
9

The influence of Dy3+ ions on physical, structural, optical..:

Kaur, Harjeet ; Kaur, Navjeet ; Bhatia, Vijeta...
Materials Research Bulletin.  169 (2024)  - p. 112519 , 2024
Link: https://doi.org/10.1016/..
 
?
10

Sensitivity and Reliability Assessment of a Strained Silico..:

, In: 2024 IEEE Latin American Electron Devices Conference (LAEDC),
Gandhi, Navneet ; Rathore, Sunil ; Jaisawal, Rajeewa Kumar... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
?
11

A proof of concept for reliability aware analysis of juncti..:

Gandhi, Navneet ; Jaisawal, Rajeewa Kumar ; Rathore, Sunil..
Smart Materials and Structures.  33 (2024)  3 - p. 035010 , 2024
Link: https://doi.org/10.1088/..
 
?
12

An adaptive mobility-aware secure handover and scheduling p..:

Kaur, Navjeet ; Mittal, Ayush ; Lilhore, Umesh Kumar...
Earth Science Informatics.  17 (2024)  3 - p. 2429-2446 , 2024
Link: https://doi.org/10.1007/..
 
?
13

Steep-Subthreshold Bilayer Tunnel Field Effect Transistor b..:

Kumar, Prateek ; Kumar, Naveen ; Dixit, Ankit...
IEEE Sensors Letters.  , 2024
Link: https://doi.org/10.1109/..
 
?
14

Low-Voltage Feedback-Field-Effect-Transistor-Based Ion Sens..:

Kumar, Prateek ; Kumar, Naveen ; Dixit, Ankit...
IEEE Sensors Letters.  8 (2024)  6 - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
?
15

Small-signal non-quasi-static model of a multi-fin FinFET f..:

Patel, Jyoti ; Aggarwal, Nitya ; Bagga, Navjeet..
Journal of Computational Electronics.  23 (2024)  2 - p. 233-243 , 2024
Link: https://doi.org/10.1007/..
 
1-15