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2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) ,
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Revisiting Test Compression Configuration in Context of Mul..:
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2022 IEEE International Test Conference (ITC) ,
3
Using Custom Fault Models to Improve Understanding of Silic..:
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Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition ,
9
Fault diagnosis in designs with extreme low pin test data c..:
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Proceedings of the 50th Annual Design Automation Conference ,
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