Kundu, Subhadip
114  Ergebnisse:
Personensuche X
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1

Revisiting Test Compression Configuration in Context of Mul..:

, In: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID),
Kundu, Subhadip ; Abraham, Jais - p. 724-729 , 2024
 
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3

Using Custom Fault Models to Improve Understanding of Silic..:

, In: 2022 IEEE International Test Conference (ITC),
 
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4

Interplay between genome organization and epigenomic altera..:

Kundu, Subhadip ; Ray, M.D. ; Sharma, Ashok
Journal of Genetics and Genomics.  48 (2021)  3 - p. 184-197 , 2021
 
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9

Fault diagnosis in designs with extreme low pin test data c..:

, In: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition,
 
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10

Scan Chain Masking for Diagnosis of Multiple Chain Failures..:

Kundu, Subhadip ; Chattopadhyay, Santanu ; Sengupta, Indranil.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  23 (2015)  7 - p. 1185-1195 , 2015
 
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11

Framework for Multiple-Fault Diagnosis Based on Multiple Fa..:

Kundu, Subhadip ; Jha, Aniket ; Chattopadhyay, Santanu..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  22 (2014)  3 - p. 696-700 , 2014
 
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12

An ATE assisted DFD technique for volume diagnosis of scan ..:

, In: Proceedings of the 50th Annual Design Automation Conference,
 
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