Kunzmann, Arno B.
62  Ergebnisse:
Personensuche X
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1

Test pattern generation hardware motivated by pseudo-exhaus..:

, In: Proceedings of the conference on European design automation,
Kunzmann, Arno B. - p. 240-245 , 1994
 
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2

Generation of deterministic test patterns by minimal basic ..:

, In: Proceedings of the conference on European design automation,
Kunzmann, Arno B. - p. 312-317 , 1992
 
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3

Advantages of the XC6000 architecture for embedded system d..:

, In: Proceedings of the 1998 ACM/SIGDA sixth international symposium on Field programmable gate arrays,
 
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4

Reduced design time by load distribution with CAD framework..:

, In: Proceedings of the conference on European design automation,
 
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5

Self-test of sequential circuits with deterministic test pa..:

Kunzmann, Arno ; Boehland, Frank
Journal of Electronic Testing.  5 (1994)  2-3 - p. 307-312 , 1994
 
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6

An analytical approach to the partial scan problem:

Kunzmann, Arno ; Wunderlich, Hans-Joachim
Journal of Electronic Testing.  1 (1990)  2 - p. 163-174 , 1990
 
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7

Design Automation of Random Testable Circuits:

, In: ESSCIRC '85: 11th European Solid-State Circuits Conference,
 
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9

Zeitschrift für Slawistik 

Zeitschrift für Slawistik ; Band 35, Heft 4
Belentschikow, R. ; Birkenmaier, W. ; Eckert, R.... - (Synchroner slawisch-deutscher Sprachvergleich). Reprint 2021 . , [2022]
 
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13

Predictive value of computed tomography on surgical resecta..:

Guggenberger, KV. ; Bley, TA. ; Held, S....
European Journal of Radiology.  163 (2023)  - p. 110834 , 2023
 
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