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L'Esperance, Nicholai
5  Ergebnisse:
Personensuche X
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1

Addressing Physically Aware Diagnosis Challenges in Hierarc..:

, In: 2023 IEEE International Test Conference India (ITC India),
Nandakumar, Bharath ; Chillarige, Sameer ; L'Esperance, Nicholai.. - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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2

Scaling physically aware logic diagnosis to complex high vo..:

, In: 2022 IEEE International Test Conference (ITC),
Nandakumar, Bharath ; Maheshwari, Madhur ; Chillarige, Sameer... - p. 340-347 , 2022
Link: https://doi.org/10.1109/..
 
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3

Machine Learning Driven Throughput Optimization of Volume D..:

, In: 2020 IEEE International Test Conference India,
Chillarige, Sameer ; Malik, Anil ; Amodeo, Martin... - p. 1-8 , 2020
Link: https://doi.org/10.1109/..
 
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4

Improved Chain Diagnosis Methodology for Clock and Control ..:

, In: 2020 IEEE International Test Conference (ITC),
Nandakumar, Bharath ; Chillarige, Sameer ; Malik, Anil... - p. 1-9 , 2020
Link: https://doi.org/10.1109/..
 
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5

Compressive Sampling Coupled OFDM Technique for Testing Con..:

Metwally, Mohamed ; L'Esperance, Nicholai ; Xia, Tian
Journal of Electronic Testing.  31 (2014)  1 - p. 75-83 , 2014
Link: https://doi.org/10.1007/..
 
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