La Torraca, Paolo
41  Ergebnisse:
Personensuche X
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2

Molecular Bridges Link Monolayers of Hexagonal Boron Nitrid..:

Ranjan, Alok ; O'Shea, Sean J. ; Padovani, Andrea...
ACS Applied Electronic Materials.  5 (2023)  2 - p. 1262-1276 , 2023
 
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3

Electrically active defects in Al2O3-InGaAs MOS stacks at c..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
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4

Modeling Degradation and Breakdown in SiO2 and High-k Gate ..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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6

Towards a Universal Model of Dielectric Breakdown:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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9

Screen-Printed Flexible Circular and Rectangular Silver Spi..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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11

Acoustic characterization of laser-induced graphene film th..:

, In: 2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO),
 
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