Laipple, D
81  Ergebnisse:
Personensuche X
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8

Label-free highly sensitive probe detection with novel hier..:

Zhang, Jingran ; Jia, Tianqi ; Yan, Yongda...
Beilstein Journal of Nanotechnology.  10 (2019)  - p. 2483-2496 , 2019
 
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9

Generic data model for semiconductor manufacturing supply c..:

, In: Proceedings of the 2018 Winter Simulation Conference,
 
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10

Aggregated hierarchical modeling and simulation in semicond..:

, In: Proceedings of the 2018 Winter Simulation Conference,
Laipple, Georg ; Mosinski, Marcin ; Schönherr, Oliver.. - p. 3603-3614 , 2018
 
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12

A review of simulation-optimization methods with applicatio..:

, In: Proceedings of the 2018 Winter Simulation Conference,
Ghasemi, Amir ; Heavey, Cathal ; Laipple, Georg - p. 3672-3683 , 2018
 
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