Lam, Dennis Chin Tou
9  Ergebnisse:
Personensuche X
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8

Transmission electron microscopy studies of interfacial rea..:

Chin, Y.T. ; Lam, P.K. ; Yow, H.K..
Journal of Materials Research.  25 (2010)  7 - p. 1304-1311 , 2010
 
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9

Investigation of mechanical shock testing of lead-free SAC ..:

Chin, Y.T. ; Lam, P.K. ; Yow, H.K..
Microelectronics Reliability.  48 (2008)  7 - p. 1079-1086 , 2008
 
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